Test equipment calibration

• US 8,692,538 B2
• Filed: 06/09/2011
• Issued: 04/08/2014
• Est. Priority Date: 06/09/2011
• Status: Active Grant

• Current Assignee: Teradyne Incorporated
• Original Assignee: Teradyne Incorporated
• Inventors: Phillips, Bradley A
• Primary Examiner(s): Koval, Melissa
• Assistant Examiner(s): NGUYEN, TRUNG Q
• Application Number:
  US13/156,651
• Publication Number:
  US 20120313618A1
• Time in Patent Office: 1,034 Days
• Field of Search: 324/74, 324/76.11, 324/423, 324/532, 324/535, 324/617, 324/677, 324/711, 324601-612, 375224-226, 714/700, 714/741
• US Class Current: 324/74
• CPC Class Codes: G01R 31/3191 Calibration

Abstract

Calibrating test equipment may include: aligning timing of a first group of channels in the test equipment; aligning timing of a second group of channels in the test equipment, with the second group of channels being different from the first group of channels; determining a misalignment in timing between a first channel and a second channel, with the first channel being from the first group of channels, and the second channel being from the second group of channels; and compensating, for the misalignment, channels in at least one of the first group or the second group.

Claims

1. A method of calibrating test equipment, the method comprising:

aligning timing of a first group of channels in the test equipment;

aligning timing of a second group of channels in the test equipment, the second group of channels being different from the first group of channels;

determining a misalignment in timing between a first channel and a second channel, the first channel being from the first group of channels, and the second channel being from the second group of channels; and

compensating, for the misalignment, channels in at least one of the first group or the second group.

2. The method of claim 1, wherein each channel comprises a driver to output a signal to a device connected to the test equipment, and a comparator to receive a signal from the device connected to the test equipment;

and

wherein aligning timing of a group of channels comprises;

determining first delays associated with drivers of the channels;

determining second delays associated with comparators of the channels; and

compensating for the first delays and the second delays;

wherein the group of channels is the first group or the second group.

3. The method of claim 2, wherein determining the first delays and determining the second delays comprise executing instructions to solve a set of linear equations that relate the first delays, the second delays, and measured comparator timings of the channels.

4. The method claim 3, wherein determining the first delays and determining the second delays comprise enabling a number of channels in the group while disabling remaining channels in the group, the set of linear equations relating the first delays, second delays of disabled channels, and measured comparator timings of enabled channels.

5. The method claim 4, further comprising selecting the number of channels so as to cycle through channels in the group to generate a sufficient number of equations.

6. The method of claim 2, wherein, as part of calibration, channels in the group of channels are electrically connected.

7. The method of claim 3, wherein compensating for the first delays and the second delays comprises programming delays into the channels that compensate for the first and second delays.

8. The method of claim 1, wherein determining misalignment in timing between the first channel and the second channel is performed automatically using a robotic calibration device.

9. The method of claim 1, wherein determining misalignment in timing between the first channel and the second channel is performed using a device interface board (DIB), the DIB shorting the first channel and the second channel and determining the misalignment by solving a set of linear equations that are determined using relationships between the first channel and the second channel.

10. A system for calibrating channels, the system comprising:

a device interface board (DIB) comprising (i) interfaces to corresponding channels of a test instrument, and (ii) circuit paths that run between the interfaces and shorting points, the circuit paths to electrically connect a first group of channels to a first shorting point and to electrically connect a second group of channels to a second shorting point, the second group of channels being different from the first group of channels;

an apparatus for use in determining a misalignment in timing between a first channel and a second channel, the first channel being from the first group of channels, and the second channel being from the second group of channels; and

a computing device programmed to (i) align timing of the first group of channels in the test equipment, (ii) align timing the second group of channels in the test equipment, and (iii) compensate, for the misalignment, channels in at least one of the first group or the second group.

11. The system of claim 10, wherein each channel comprises a driver to output a signal to a device connected to the test equipment, and a comparator to receive a signal from the device connected to the test equipment;

and

wherein aligning a group of channels comprises;

determining first delays associated with drivers of the channels;

determining second delays associated with comparators of the channels; and

compensating for the first delays and the second delays;

wherein the group of channels is the first group or the second group.

12. The system of claim 11, wherein determining the first delays and determining the second delays comprise solving a set of linear equations that relate the first delays, the second delays, and measured comparator timings of the channels.

13. The system of claim 12, wherein compensating for the first delays and the second delays comprises programming delays into the channels that compensate for the first and second delays.

14. The system of claim 10, wherein the apparatus comprises a robotic calibration device.

15. The system of claim 10, wherein the apparatus comprises a second DIB, the second DIB for electrically connecting the first channel and the second channel and the computing device being programmed to determine the misalignment by solving a set of linear equations that are determined using relationships between the first channel and the second channel.

16. A method for calibrating channels, each of the channels having a driver delay and a comparator delay, the method comprising:

organizing the channels into groups of channels, each group being electrically connected to a shorting point;

for each group of channels;

enabling a number of channels while disabling a remainder of the channels;

measuring, at the disabled channels, timing of a composite signal composed of the enabled channels;

generating a system of equations in which, for each disabled channel, a comparator time is equated to an average of a driver time for all enabled channels;

solving the system of equations to obtain, for each channel, the driver delay and the comparator delay; and

calibrating the channels in each group using the driver delay and the comparator delay;

selecting a channel from each group;

aligning the selected channels; and

aligning all channels in a group based on alignment of the selected channels.

17. The method of claim 16, wherein the groups are connected to a shorting point on a device interface board (DIB) that is connected to an instrument containing the channels.

18. The method of claim 16, wherein aligning the selected channels comprises measuring misalignment of the selected channels using a robotic calibration device and an oscilloscope.

19. The method of claim 18, wherein the selected channels are electrically connected on a device interface board (DIB).

20. An apparatus for calibrating test equipment, the apparatus comprising:

first means for (i) aligning timing of a first group of channels in the test equipment, and (ii) aligning timing of a second group of channels in the test equipment, the second group of channels being different from the first group of channels; and

second means for determining a misalignment in timing between a first channel and a second channel, the first channel being from the first group of channels, and the second channel being from the second group of channels;

wherein the first means is also for compensating, for the misalignment, channels in at least one of the first group or the second group.

21. One or more non-transitory machine-readable storage media storing instructions that are executable to calibrate channels that are organized into groups of channels, each group being electrically connected to a shorting point, the instructions being executable by one or more processing devices to perform operations comprising:

for each group of channels;

generating a system of equations in which, for each disabled channel, a comparator time is equated to an average of a driver time for all enabled channels;

solving the system of equations to obtain, for each channel, the driver delay and the comparator delay; and

calibrating the channels in each group using the driver delay and the comparator delay;

selecting a channel from each group; and

aligning all channels in a group based on an alignment of the selected channels.

22. The one or more non-transitory machine-readable storage media of claim 21, wherein the selected channels are electrically connected on a device interface board (DIB).