Input device transmitter path error diagnosis
First Claim
1. A processing system configured for capacitive sensing, said processing system comprising:
- transmitter circuitry configured to transmit during a first time period with a first transmitter path of a plurality of transmitter paths in an input device, wherein each transmitter path of said plurality of transmitter paths is configured for capacitive sensing;
a first internal diagnostic mechanism comprising;
a selectable leakage path,a buffered output coupled with said selectable leakage path and said first transmitter path, anda selectable diagnostic node coupled as an input select of said selectable leakage path, wherein said selectable leakage path is configured to be coupled with said transmitter circuitry to intentionally discharge a charged portion of said transmitter circuitry with which said selectable leakage path is coupled; and
a determination module configured to determine when a discontinuity exists within said first transmitter path based on a discharge rate for said first transmitter path, wherein said discharge rate is acquired during a second time period via said selectable leakage path of said first internal diagnostic mechanism, wherein said second time period occurs after said first time period.
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Abstract
A processing system configured for capacitive sensing comprises transmitter circuitry, a first internal diagnostic mechanism, and a determination module. The transmitter circuitry is configured to transmit during a first time period with a first transmitter path of a plurality of transmitter paths in an input device. Each transmitter path of the plurality of transmitter paths is configured for capacitive sensing. The first internal diagnostic mechanism comprises a selectable leakage path. The selectable leakage path is configured to be coupled with the transmitter circuitry. The determination module is configured to determine if a discontinuity exists within the first transmitter path based on a discharge rate for the first transmitter path. The discharge rate is acquired during a second time period via the selectable leakage path of the first internal diagnostic mechanism, wherein the second time period occurs after the first time period.
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Citations
19 Claims
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1. A processing system configured for capacitive sensing, said processing system comprising:
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transmitter circuitry configured to transmit during a first time period with a first transmitter path of a plurality of transmitter paths in an input device, wherein each transmitter path of said plurality of transmitter paths is configured for capacitive sensing; a first internal diagnostic mechanism comprising; a selectable leakage path, a buffered output coupled with said selectable leakage path and said first transmitter path, and a selectable diagnostic node coupled as an input select of said selectable leakage path, wherein said selectable leakage path is configured to be coupled with said transmitter circuitry to intentionally discharge a charged portion of said transmitter circuitry with which said selectable leakage path is coupled; and a determination module configured to determine when a discontinuity exists within said first transmitter path based on a discharge rate for said first transmitter path, wherein said discharge rate is acquired during a second time period via said selectable leakage path of said first internal diagnostic mechanism, wherein said second time period occurs after said first time period. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A capacitive sensing device comprising:
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a plurality of transmitter paths, wherein each transmitter path of the plurality of transmitter paths is configured to for capacitive sensing; and a processing system coupled with said plurality of transmitter paths, said processing system configured to; transmit during a first time period with a first transmitter path of said plurality of transmitter paths; enable a selectable leakage path of a first internal diagnostic mechanism of said processing system during a second time period, said first internal diagnostic mechanism comprising said selectable leakage path, a buffered output coupled with said selectable leakage path and said first transmitter path, and a selectable diagnostic node coupled as an input select of said selectable leakage path, wherein responsive to enablement said selectable leakage path is configured to be coupled with said first transmitter path to intentionally discharge a charge accumulated on said first transmitter path; and determine when a discontinuity exists within said first transmitter path based on a discharge rate for said first transmitter path, wherein said discharge rate is acquired during a second time period via said selectable leakage path of said first internal diagnostic mechanism, and wherein said second time period occurs after said first time period. - View Dependent Claims (11, 12, 13, 14)
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15. A method of input device transmitter path error diagnosis, said method comprising:
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transmitting during a first time period with a first transmitter path of a plurality of transmitter paths in an input device, wherein each transmitter path of said plurality of transmitter paths is configured for capacitive sensing; enabling a selectable leakage path of an internal diagnostic mechanism of a processing system during a second time period, said internal diagnostic mechanism comprising said selectable leakage path, a buffered output coupled with said selectable leakage path and said first transmitter path, and a selectable diagnostic node coupled as an input select of said selectable leakage path, wherein responsive to enablement said selectable leakage path is configured to intentionally discharge a charge accumulated on said first transmitter path; and determining when a discontinuity exists within said first transmitter path based on a discharge rate for said first transmitter path, wherein said discharge rate is acquired during a second time period via said selectable leakage path of said internal diagnostic mechanism of said processing system of said input device, wherein said second time period occurs after said first time period. - View Dependent Claims (16, 17, 18, 19)
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Specification