Methods of testing wireless devices in over-the-air radio-frequency test systems without path loss characterization
First Claim
1. A method of calibrating a wireless test station, wherein the wireless test station includes a test chamber having an antenna, a test unit, and a radio-frequency cable that connects the antenna to the test unit, the method comprising:
- with a test host, computing a linear function, wherein the linear function provides an expected output power value as its output by receiving a requested output power value as its input;
with the test host, directing a reference device under test to produce radio-frequency signals at a first requested output power level during a first time period; and
with the test host, directing the reference device under test to produce radio-frequency signals at a second requested output power level during a second time period.
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Abstract
A method for testing wireless devices under test (DUTs) in a wireless test station is provided. Each test station may include a test unit, a test chamber with an antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference DUTs may be used to calibrate each test station to compute a corrected linear equation based on a nominal path loss value. Over-the-air (OTA) path loss of each test station may not be directly measured. Once calibrated, the test chambers may be used during product testing to test factory DUTs to determine whether a particular factory DUT satisfies pass/fail criteria. During product testing, measured output power levels may be compared with expected output power levels computed using the corrected linear equation. The amount of error between the measured and expected output power levels will determine whether a production DUT satisfies the pass/fail criteria.
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Citations
19 Claims
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1. A method of calibrating a wireless test station, wherein the wireless test station includes a test chamber having an antenna, a test unit, and a radio-frequency cable that connects the antenna to the test unit, the method comprising:
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with a test host, computing a linear function, wherein the linear function provides an expected output power value as its output by receiving a requested output power value as its input; with the test host, directing a reference device under test to produce radio-frequency signals at a first requested output power level during a first time period; and with the test host, directing the reference device under test to produce radio-frequency signals at a second requested output power level during a second time period. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of calibrating test equipment for testing devices under test, comprising:
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with the test equipment, configuring a reference device under test to produce signals at different requested output power levels; with the test equipment, measuring output power levels while the reference device under test is producing the signals at the different requested output power levels; and with the test equipment, computing a corrected linear equation based on the measured output power levels. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19)
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Specification