Signal detection and triggering using a difference bitmap

• US 8,706,435 B2
• Filed: 05/28/2010
• Issued: 04/22/2014
• Est. Priority Date: 05/06/2010
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Engholm, Kathryn A., Turpin, John F.
• Primary Examiner(s): Teixeira Moffat, Jonathan C.
• Assistant Examiner(s): BETSCH, REGIS J
• Application Number:
  US12/790,403
• Publication Number:
  US 20110273469A1
• Time in Patent Office: 1,425 Days
• Field of Search: 702/66, 702/67, 702/76, 702/77, 702/108, 702/195
• US Class Current: 702/77
• CPC Class Codes: G01R 13/0227 Controlling the intensity or colour of the display
• CPC Class Codes: G01R 13/0254 for triggering, synchronisation
• CPC Class Codes: G01R 13/0263 for non-recurrent functions, e.g. transients

Abstract

A test and measurement instrument converts digital data that represents an input signal into a plurality of bitmaps, and then subtracts one of the bitmaps from another one of the bitmaps to produce a difference bitmap. The difference bitmap does not contain density values that are common to the two bitmaps, but instead only contains the density differences between the two, thereby revealing very small density variations in the presence of large density values. In some embodiments, the difference bitmap is displayed on a display device. In other embodiments, the difference bitmap is used to generate a trigger signal.

Claims

1. A test and measurement instrument comprising:

an analog-to-digital converter for receiving an input radio frequency signal and producing a digital signal; and

a processor configured to;

process digital data from the digital signal by converting it into a series of temporal frequency spectra by frequency transform,

accumulate the frequency spectra in a plurality of bitmaps by rasterizing each frequency spectrum, each rasterized frequency spectrum comprising an array of cells, and summing the values of each corresponding cell of each rasterized frequency spectrum in a particular frame to form one of the plurality of bitmaps, and

subtract one of the bitmaps referred to as a reference bitmap from another one of the bitmaps to produce a density difference bitmap.

2. A test and measurement instrument as in claim 1 wherein the processor processes the digital data in real-time.

3. A test and measurement instrument as in claim 1 wherein the processor processes the digital data after it has been stored in a memory in response to a trigger signal.

5. A test and measurement instrument as in claim 2 wherein the processor converts the digital data into a series of bitmaps in real-time and subtracts the reference bitmap from each newly created bitmap.

6. A test and measurement instrument as in claim 5 wherein the processor updates the reference bitmap.

7. A test and measurement instrument as in claim 6 wherein the processor updates the reference bitmap in response to a user command.

8. A test and measurement instrument as in claim 6 wherein the processor updates the reference bitmap in response to a signal that is generated internally or externally to the test and measurement instrument.

9. A test and measurement instrument as in claim 6 wherein the processor updates the reference bitmap periodically.

10. A test and measurement instrument as in claim 9 wherein the processor updates the reference bitmap after each bitmap is created.

11. A test and measurement instrument as in claim 9 wherein the processor updates the reference bitmap after every N bitmaps is created, where N is a user-specified integer that is greater than one.

12. A test and measurement instrument as in claim 1 wherein the density difference bitmap is displayed on a display device.

13. A test and measurement instrument as in claim 1 wherein the processor uses the density difference bitmap to perform a measurement.

14. A test and measurement instrument as in claim 1 wherein the processor indicates when a signal appears or disappears within the density difference bitmap.

15. A test and measurement instrument as in claim 1 wherein the test and measurement instrument is a test and measurement instrument selected from the group consisting of a realtime spectrum analyzer, a swept spectrum analyzer, a vector signal analyzer, a logic analyzer, and an oscilloscope.

4. A test and measurement instrument comprising:

an analog-to-digital converter for receiving an input signal and producing a digital signal;

a trigger detector for processing digital data from the digital signal by;

converting it into a series of temporal frequency spectra by frequency transform,

accumulating the frequency spectra in a plurality of bitmaps by rasterizing each frequency spectrum, each rasterized frequency spectrum comprising an array of cells, and summing the values of each corresponding cell of each rasterized frequency spectrum to form the plurality of bitmaps, and

subtracting one of the bitmaps referred to as a reference bitmap from another one of the bitmaps to produce a density difference bitmap, and for generating a trigger signal when the density difference bitmap satisfies a user-specified trigger criterion; and

a memory for storing digital data from the digital signal in response to the trigger signal.

16. A test and measurement instrument as in claim 4 wherein the trigger detector converts the digital data into a series of bitmaps in real-time and subtracts the reference bitmap from each newly created bitmap.

17. A test and measurement instrument as in claim 16 wherein the trigger detector updates the reference bitmap.

18. A test and measurement instrument as in claim 17 wherein the trigger detector updates the reference bitmap in response to a user command.

19. A test and measurement instrument as in claim 17 wherein the processor updates the reference bitmap in response to a signal that is generated internally or externally to the test and measurement instrument.

20. A test and measurement instrument as in claim 17 wherein the trigger detector updates the reference bitmap periodically.

21. A test and measurement instrument as in claim 20 wherein the trigger detector updates the reference bitmap after each bitmap is created.

22. A test and measurement instrument as in claim 20 wherein the trigger detector updates the reference bitmap after every N bitmaps is created, where N is a user-specified integer that is greater than one.

23. A test and measurement instrument as in claim 4 wherein the density difference bitmap is displayed on a display device.

24. A test and measurement instrument as in claim 4 wherein the trigger detector uses the density difference bitmap to perform a measurement.

25. A test and measurement instrument as in claim 4 wherein the trigger detector indicates when a signal appears or disappears within the density difference bitmap.

26. A test and measurement instrument as in claim 4 wherein the test and measurement instrument is a test and measurement instrument selected from the group consisting of a realtime spectrum analyzer, a swept spectrum analyzer, a vector signal analyzer, a logic analyzer, and an oscilloscope.

27. A test and measurement instrument as in claim 4 wherein the density difference bitmap satisfies the user-specified trigger criterion when a density difference within the density difference bitmap exceeds a user-specified density threshold.