Scanning transmission electron microscope and axial adjustment method thereof
First Claim
1. A scanning transmission electron microscope system, comprising:
- an electron source;
a condenser lens configured to converge an electron beam emitted from the electron source;
a deflector configured to cause the electron beam to perform scanning on a sample;
an aberration correction device configured to correct an aberration of the electron beam;
a convergence aperture configured to determine a convergent angle of the electron beam; and
a detector configured to detect electrons passing through or diffracted by the sample, whereinthe system acquires information on contrast of a Ronchigram formed by the electron beam passing through the sample, and determines a position of the convergence aperture on the basis of the information.
1 Assignment
0 Petitions
Accused Products
Abstract
A scanning transmission electron microscope equipped with an aberration corrector is capable of automatically aligning the position of a convergence aperture with the center of an optical axis irrespective of skill and experience of an operator. The scanning transmission electron microscope system includes an electron source; a condenser lens configured to converge an electron beam emitted from the electron source; a deflector configured to cause the electron beam to perform scanning on a sample; an aberration correction device configured to correct an aberration of the electron beam; a convergence aperture configured to determine a convergent angle of the electron beam; and a detector configured to detect electrons passing through or diffracted by the sample. The system acquires information on contrast of a Ronchigram formed by the electron beam passing through the sample, and determines a position of the convergence aperture on the basis of the information.
-
Citations
6 Claims
-
1. A scanning transmission electron microscope system, comprising:
-
an electron source; a condenser lens configured to converge an electron beam emitted from the electron source; a deflector configured to cause the electron beam to perform scanning on a sample; an aberration correction device configured to correct an aberration of the electron beam; a convergence aperture configured to determine a convergent angle of the electron beam; and a detector configured to detect electrons passing through or diffracted by the sample, wherein the system acquires information on contrast of a Ronchigram formed by the electron beam passing through the sample, and determines a position of the convergence aperture on the basis of the information. - View Dependent Claims (2, 3, 4, 5, 6)
-
Specification