Method for testing multi-chip stacked packages
First Claim
1. A method for testing a plurality of multi-chip stacked packages, comprising:
- providing one or more substrate-less chip cubes each consisting of a plurality of vertically stacked chips, wherein a stacked gap is formed between two adjacent chips and a plurality of testing electrodes are disposed on a top chip surface of each substrate-less chip cube;
attaching the substrate-less chip cubes onto an adhesive tape with the testing electrodes away from the adhesive tape, wherein the adhesive tape is attached inside an opening of a tape carrier, wherein the tape carrier is a strip;
forming a filling encapsulant on the adhesive tape to fully fill the stacked gaps between the stacked chips;
fixing the tape carrier on a wafer testing carrier to allow the substrate-less chip cubes being loaded into a wafer tester without releasing from the adhesive tape;
wherein the wafer testing carrier has a disc-shaped major body made of a hard material to provide a placing surface larger than the adhesive tape, and the adhesive tape is completely attached onto the placing surface so that the substrate-less chip cubes are supported on the wafer testing carrier; and
probing the testing electrodes of the substrate-less chip cubes by a plurality of testing probes inside a wafer tester to electrically test the substrate-less chip cubes.
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Accused Products
Abstract
Disclosed is a method for testing multi-chip stacked packages. Initially, one or more substrate-less chip cubes are provided, each consisting of a plurality of chips such as chips stacked together having vertically connected with TSV'"'"'s where there is a stacked gap between two adjacent chips. Next, the substrate-less chip cubes are adhered onto an adhesive tape where the adhesive tape is attached inside an opening of a tape carrier. Then, a filling encapsulant is formed on the adhesive tape to completely fill the chip stacked gaps. Next, the tape carrier is fixed on a wafer testing carrier in a manner to allow the substrate-less chip cubes to be loaded into a wafer tester without releasing from the adhesive tape. Accordingly, the probers of the wafer tester can be utilized to probe testing electrodes of the substrate-less chip cubes so that it is easy to integrate this testing method in TSV fabrication processes.
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Citations
9 Claims
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1. A method for testing a plurality of multi-chip stacked packages, comprising:
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providing one or more substrate-less chip cubes each consisting of a plurality of vertically stacked chips, wherein a stacked gap is formed between two adjacent chips and a plurality of testing electrodes are disposed on a top chip surface of each substrate-less chip cube; attaching the substrate-less chip cubes onto an adhesive tape with the testing electrodes away from the adhesive tape, wherein the adhesive tape is attached inside an opening of a tape carrier, wherein the tape carrier is a strip; forming a filling encapsulant on the adhesive tape to fully fill the stacked gaps between the stacked chips; fixing the tape carrier on a wafer testing carrier to allow the substrate-less chip cubes being loaded into a wafer tester without releasing from the adhesive tape; wherein the wafer testing carrier has a disc-shaped major body made of a hard material to provide a placing surface larger than the adhesive tape, and the adhesive tape is completely attached onto the placing surface so that the substrate-less chip cubes are supported on the wafer testing carrier; and probing the testing electrodes of the substrate-less chip cubes by a plurality of testing probes inside a wafer tester to electrically test the substrate-less chip cubes. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification