Methods and devices for detecting and measuring environmental conditions in high performance device packages
First Claim
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1. An environmental condition monitoring device comprising:
- an interferometric modulator comprising;
a substrate;
an optical enhancement layer disposed on the substrate, the optical enhancement layer comprising a reflector layer,an environmental reactive layer disposed on the optical enhancement layer, the environmental reactive layer having a composition, the composition of the environmental reactive layer configured to alter in response to exposure to an environmental condition;
the environmental reactive layer and reflector layer defining boundaries for an interferometric cavity of the interferometric modulator, the environmental reactive layer being configured to act as an absorber layer of the interferometric modulator, a thickness of the environmental reactive layer being less than a thickness of the reflector layer, a reflectivity spectrum of the interferometric modulator being a function of the composition of the environmental reactive layer, wherein the environmental reactive layer is one of the following;
a metal, a metal alloy, and a semiconductor.
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Abstract
An environmental condition sensing device includes an interferometric modulator with optical properties, which change in response to being exposed to a predetermined environmental threshold or condition. The device includes an environmental reactive layer, which alters composition, in an optically-detectable manner, in response to being exposed to a predetermined environmental threshold or condition.
109 Citations
19 Claims
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1. An environmental condition monitoring device comprising:
an interferometric modulator comprising; a substrate; an optical enhancement layer disposed on the substrate, the optical enhancement layer comprising a reflector layer, an environmental reactive layer disposed on the optical enhancement layer, the environmental reactive layer having a composition, the composition of the environmental reactive layer configured to alter in response to exposure to an environmental condition; the environmental reactive layer and reflector layer defining boundaries for an interferometric cavity of the interferometric modulator, the environmental reactive layer being configured to act as an absorber layer of the interferometric modulator, a thickness of the environmental reactive layer being less than a thickness of the reflector layer, a reflectivity spectrum of the interferometric modulator being a function of the composition of the environmental reactive layer, wherein the environmental reactive layer is one of the following;
a metal, a metal alloy, and a semiconductor.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An environmental condition monitoring device comprising:
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a substrate; an optical enhancement means disposed on the substrate, the optical enhancement means comprising a light reflecting means; and an absorber for altering the reflectivity spectrum of the light reflecting means in response to exposure to an environmental condition, wherein the absorber is disposed on the optical enhancement means, the absorber and reflecting means defining boundaries for an interferometric cavity, a thickness of the absorber being less than a thickness of the reflecting means, wherein the absorber is one of the following;
a metal, a metal alloy, and a semiconductor. - View Dependent Claims (13, 14)
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15. A method of manufacturing an environmental condition monitoring device, the method comprising:
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providing a substrate; forming an optical enhancement layer on the substrate, the optical enhancement layer including a reflector layer, forming an environmental reactive layer on the optical enhancement layer, the environmental reactive layer and reflector layer defining boundaries for an interferometric cavity of an interferometric modulator, the environmental reactive layer being configured to act as an absorber layer of the interferometric modulator, a thickness of the environmental reactive layer being less than a thickness of the reflector layer, a reflectivity of the interferometric modulator being a function of the composition of the environmental reactive layer, wherein the environmental reactive layer is one of the following;
a metal, a metal alloy, and a semiconductor. - View Dependent Claims (16, 17)
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18. A method of detecting exposure to an environmental condition, the method comprising:
providing an interferometric modulator having a reflector layer configured to substantially reflect light disposed on a substrate, and an environmental reactive layer, the environmental reactive layer disposed on a dielectric layer disposed on the reflector layer, a composition of the environmental reactive layer being configured to alter in response to exposure to the environmental condition, the environmental reactive layer and reflector layer defining boundaries for an interferometric cavity of the interferometric modulator, the environmental reactive layer being configured to act as an absorber layer of the interferometric modulator, a thickness of the environmental reactive layer being less than a thickness of the reflector layer, a reflectivity of the interferometric modulator being a function of the composition of the environmental reactive layer, wherein the environmental reactive layer is one of the following;
a metal, a metal alloy, and a semiconductor.- View Dependent Claims (19)
Specification