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Probe devices formed from multiple planar layers of structural material with tip regions formed from one or more intermediate planar layers

  • US 8,717,055 B2
  • Filed: 10/03/2011
  • Issued: 05/06/2014
  • Est. Priority Date: 02/04/2003
  • Status: Active Grant
First Claim
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1. A probe device for contacting an electronic component comprising:

  • a multi-layer body comprising at least three stair stepped planar layers of structural material with each layer adhered to at least one adjacent layers, comprising;

    at least one mounting region for fixedly mounting the probe to a substrate,a tip region for making temporary contact with the electronic component; and

    a middle region configured to provide a spring force for providing compliant contact between the tip region and the electronic componentwherein the tip region is formed from one or more intermediate layers located between a first layer and a last layer, and wherein the tip region formed from the one or more intermediate layers extends beyond structural material of the first and last layer.

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