System for detecting conductive coatings on non-conductive medium surfaces
First Claim
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1. A method for detecting at least one conductive coating on at least one non-conductive medium having a defined thickness, comprising:
- i) measuring capacitance of at least one conductive coating on at least one surface of the at least one non-conductive medium;
ii) comparing the measured capacitance data of step i) with the thickness of the at least one non-conductive medium;
wherein the step ii) includes comparing;
a) at least one measured capacitance value and/or any results that occur from a changing capacitance value, tob) a range of stored capacitance value data and/or trigger point(s) that correspond to the medium thickness; and
,iii) identifying the presence and surface location of the at least one conductive coating on the surface of the non-conductive medium.
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Abstract
Methods and apparatuses for detecting the presence and/or location of any conductive coating on a non-conductive medium surface are described.
24 Citations
57 Claims
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1. A method for detecting at least one conductive coating on at least one non-conductive medium having a defined thickness, comprising:
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i) measuring capacitance of at least one conductive coating on at least one surface of the at least one non-conductive medium; ii) comparing the measured capacitance data of step i) with the thickness of the at least one non-conductive medium;
wherein the step ii) includes comparing;a) at least one measured capacitance value and/or any results that occur from a changing capacitance value, to b) a range of stored capacitance value data and/or trigger point(s) that correspond to the medium thickness; and
,iii) identifying the presence and surface location of the at least one conductive coating on the surface of the non-conductive medium. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 54, 55)
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15. A method for detecting at least one conductive coating on at least one non-conductive medium having a defined thickness, comprising:
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i) measuring capacitance of at least one conductive coating on at least one surface of the at least one non-conductive medium; ii) comparing the measured capacitance data of step i) with the thickness of the at least one non-conductive medium; and
,iii) identifying the presence and surface location of the at least one conductive coating on the surface of the non-conductive medium; wherein the method includes; measuring a temperature of one or more of;
the non-conductive medium; and
an environment in which the non-conductive medium is present.- View Dependent Claims (16, 17)
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18. An apparatus for detecting the presence and surface location of at least one conductive coating on at least one surface of at least one non-conductive medium, comprising
a capacitive-measuring sensor configured to generate a capacitance value in the presence of a conductive layer on a surface of at least one non-conductive medium; - and
a processor configured for identifying the presence and surface location of one or more conductive coatings on at least one surface of the non-conductive medium by correlating a value of the capacitance measured with the thickness of the non-conductive medium;
wherein the processor is configured for comparing;i) at least one measured capacitance value and/or any results occurring from a changing capacitance value, to ii) a range of stored capacitance values and/or trigger points corresponding to the thickness of the non-conductive medium. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 31, 32, 33, 56, 57)
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29. An apparatus for detecting the presence and surface location of at least one conductive coating on at least one surface of at least one non-conductive medium, comprising
a capacitive-measuring sensor configured to generate a capacitance value in the presence of a conductive layer on a surface of at least one non-conductive medium; - and
a processor configured for identifying the presence and surface location of one or more conductive coatings on at least one surface of the non-conductive medium by correlating a value of the capacitance measured with the thickness of the non-conductive medium; and a temperature sensor configured for measuring temperatures of one or more of;
the non-conductive medium;
an environment in which the non-conductive medium is present;
a sensor configured for measuring the capacitance; and
sensor configured for measuring the thickness of the non-conductive medium;wherein the temperature sensor is configured for measuring the temperature of the medium and the environment substantially simultaneously during the measuring of the capacitance values.
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30. An apparatus for detecting the presence and surface location of at least one conductive coating on at least one surface of at least one non-conductive medium, comprising
a capacitive-measuring sensor configured to generate a capacitance value in the presence of a conductive layer on a surface of at least one non-conductive medium; - and
a processor configured for identifying the presence and surface location of one or more conductive coatings on at least one surface of the non-conductive medium by correlating a value of the capacitance measured with the thickness of the non-conductive medium; and a temperature sensor configured for measuring temperatures of one or more of;
the non-conductive medium;
an environment in which the non-conductive medium is present;
a sensor configured for measuring the capacitance; and
sensor configured for measuring the thickness of the non-conductive medium;wherein the processor is configured for adjusting one or more corresponding capacitive measurements based on a measured thermal response to yield a test result that is not impacted by varying temperatures.
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34. A method for measuring thickness of a medium using a charge coupled device (CCD) linear image array having a plurality of sensor elements, the method comprising regulating energy carryover effects from one sensor element to another sensor element;
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wherein the method includes; a) regulating energy carryover effects by; a-1) controlling intensity of energy from an energy source as the energy is directed to the medium; and
/ora-2) adjusting sensitivity of the CCD linear image array as the energy source is directed to the medium; and
/ora-3) adjusting shutter speed of the CCD linear image array as the energy source is directed to the medium; b) monitoring the intensity of reflections of the energy from the medium onto the CCD linear image array; and
,c) substantially preventing the measured energy reflections of step b) from saturating or entering any other undesirable state, wherein the energy reflections have a peak reflection having a center, and d) substantially preventing the center of the peak reflection and/or the peak reflection itself from shifting onto one or more adjacent pixel elements than desired on the CCD linear image array when the measurement is performed. - View Dependent Claims (35, 36, 37, 38, 39, 40, 41, 42, 43)
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44. An apparatus for measuring a thickness of a medium, comprising a charge coupled device (CCD) array comprised of a plurality of sensor elements, the apparatus being configured to regulate energy carryover effects from one sensor element to another sensor element;
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an energy source, a sensor comprised of the CCD linear image array, and a processor configured for; a-1) controlling intensity of energy from the energy source as the energy is directed to the medium; and
/ora-2) adjusting sensitivity of the CCD linear image array as the energy source is directed to the medium; and
/ora-3) adjusting a shutter speed of the CCD linear image array as the energy source is directed to the medium; b) monitoring the intensity of reflections of the energy from the medium onto the CCD linear image array; and
,c) substantially preventing the measured energy reflections of step b) from saturating or entering any other undesirable state, wherein the energy reflections have a peak reflection having a center; and d) substantially preventing the center of the peak reflection and/or the peak reflection itself from shifting onto one or more adjacent pixel elements in the CCD linear image array. - View Dependent Claims (45, 46, 47, 48, 49, 50, 51, 52, 53)
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Specification