Methods, devices and kits for peri-critical reflectance spectroscopy
First Claim
1. An apparatus for detecting the spectral characteristics of a sample comprising:
- an electromagnetic radiation source adapted to excite the sample with electromagnetic radiation;
a crystal in communication with the electromagnetic radiation source and the sample, the crystal having a refractive index higher than that of the sample;
a reflector adapted to introduce the electromagnetic radiation to a measurement site of the sample at a plurality of angles of incidence encompassing a critical angle between the crystal and the sample;
a detector for detecting electromagnetic radiation from the sample; and
a processing device in communication with the detector, the processing device adapted to receive information from the detector obtained at a plurality of angles about the critical angle with millidegree resolution and to identify the intensity of reflected electromagnetic radiation at angles proximate to the critical angle.
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Abstract
Spectroscopy apparatuses oriented to the critical angle of the sample are described that detect the spectral characteristics of a sample. The apparatus includes an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to a measurement site of the sample at a plurality of angles of incidence near a critical angle of the sample and a transmitting crystal in communication with the electromagnetic radiation source and the sample. The transmitting crystal may have a high refractive index adapted to reflect the electromagnetic radiation internally. The apparatus includes a reflector adapted to introduce the electromagnetic radiation to a measurement site of the sample at a plurality of angles of incidence near the critical angle between the transmitting crystal and sample. The apparatus includes a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflectance spectroscopy apparatus.
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Citations
31 Claims
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1. An apparatus for detecting the spectral characteristics of a sample comprising:
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an electromagnetic radiation source adapted to excite the sample with electromagnetic radiation; a crystal in communication with the electromagnetic radiation source and the sample, the crystal having a refractive index higher than that of the sample; a reflector adapted to introduce the electromagnetic radiation to a measurement site of the sample at a plurality of angles of incidence encompassing a critical angle between the crystal and the sample; a detector for detecting electromagnetic radiation from the sample; and a processing device in communication with the detector, the processing device adapted to receive information from the detector obtained at a plurality of angles about the critical angle with millidegree resolution and to identify the intensity of reflected electromagnetic radiation at angles proximate to the critical angle. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. A method for detecting the spectral characteristics of a sample comprising:
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placing a sample in proximity to a crystal; introducing electromagnetic radiation from an electromagnetic radiation source to a measurement site of the sample through the crystal at a plurality of angles of incidence encompassing a critical angle of the sample; and detecting electromagnetic radiation from the sample with millidegree resolution about the critical angle. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30, 31)
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Specification