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Micro electro mechanical switch system and method for testing and configuring semiconductor functional circuits

  • US 8,732,644 B1
  • Filed: 09/15/2004
  • Issued: 05/20/2014
  • Est. Priority Date: 09/15/2003
  • Status: Active Grant
First Claim
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1. An integrated circuit comprising:

  • a plurality of functional components for performing processing operations;

    a distribution component for distributing information to said plurality of functional components;

    a functional component configuration controller for configuring operational characteristics of one or more of said plurality of functional components; and

    a micro electro-mechanical switch for selectively coupling and decoupling one or more of said plurality of functional components to and from a bus.

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