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System and method for imaging apparatus calibration

  • US 8,743,340 B2
  • Filed: 12/29/2009
  • Issued: 06/03/2014
  • Est. Priority Date: 12/31/2008
  • Status: Active Grant
First Claim
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1. A method, comprising:

  • positioning an image sensor at a first specified angle relative to a projected image plane;

    projecting a test pattern onto the projected image plane;

    positioning an aperture between the image sensor and the projected image plane;

    positioning the image sensor such that a first pixel row of the image sensor is at a second angle relative to an edge of the test pattern;

    iteratively scanning the test pattern and adjusting a projector focus value to maximize an image focus index, the image focus index comprising a function of at least one harmonic frequency amplitude of a test pattern scan.

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