System and method for imaging apparatus calibration
First Claim
1. A method, comprising:
- positioning an image sensor at a first specified angle relative to a projected image plane;
projecting a test pattern onto the projected image plane;
positioning an aperture between the image sensor and the projected image plane;
positioning the image sensor such that a first pixel row of the image sensor is at a second angle relative to an edge of the test pattern;
iteratively scanning the test pattern and adjusting a projector focus value to maximize an image focus index, the image focus index comprising a function of at least one harmonic frequency amplitude of a test pattern scan.
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Abstract
A system is disclosed including an image sensor positioned at a first specified angle relative to a projected image plane. The system includes a projector that projects a test pattern onto the projected image plane. A controller is structured to iteratively adjust the projector focus until an image focus index is maximized, where the image focus index is a function of an amplitude of at least one harmonic frequency of a scan of the test pattern. The controller is further structured to determine a skew indicator value and adjust a projector skew adjustment. The controller is further structured to compare a current zoom level to a target zoom level and adjust a projector zoom. The projected image plane is a manufacturing surface, where the projected image is utilized in a manufacturing process.
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Citations
36 Claims
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1. A method, comprising:
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positioning an image sensor at a first specified angle relative to a projected image plane; projecting a test pattern onto the projected image plane; positioning an aperture between the image sensor and the projected image plane; positioning the image sensor such that a first pixel row of the image sensor is at a second angle relative to an edge of the test pattern; iteratively scanning the test pattern and adjusting a projector focus value to maximize an image focus index, the image focus index comprising a function of at least one harmonic frequency amplitude of a test pattern scan. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A system, comprising:
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a projector structured to project a test pattern onto a projected image plane; an image sensor positioned at a first specified angle relative to the projected image plane, wherein a first pixel row of the image sensor is positioned at a second angle relative to an edge of the test pattern; an aperture positioned between the image sensor and the projected image plane; a controller structured to iteratively scan the test pattern and adjust a projector focus value to maximize an image focus index, the image focus index comprising a function of at least one harmonic frequency amplitude of a test pattern scan; and wherein the projector is further structured to project a production image onto a manufacturing surface. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. An apparatus, comprising:
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a scanning module structured to provide an image sensor scan command, wherein an image sensor creates a test pattern scan in response to the image sensor scan command, wherein the test pattern scan comprises a scan of a test pattern projected onto a manufacturing surface; a focus definition module structured to determine an image focus index comprising a function of at least one harmonic frequency amplitude of the test pattern scan; and a focus control module structured to iteratively adjust a projector focus value to maximize the image focus index. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32)
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33. A system, comprising:
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a manufacturing surface, an image projector, an imaging sensor, and an aperture disposed between the manufacturing surface and the imaging sensor; wherein the imaging sensor is positioned at a first specified angle relative to the manufacturing surface and a first pixel row of the imaging sensor is positioned at a second angle relative to an edge of a test pattern projected onto the manufacturing surface; means for maximizing an image focus index; means for iteratively scanning the test pattern and adjusting a projector focus value; and wherein in the means for maximizing the image focus index, the image focus index comprises a function of at least one harmonic frequency amplitude of a test pattern scan. - View Dependent Claims (34, 35, 36)
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Specification