Method of manufacturing semiconductor device, and semiconductor device
First Claim
1. A semiconductor device, comprising:
- a first-conductivity-type semiconductor layer;
a base region of a second-conductivity-type formed in an upper portion of the first-conductivity-type semiconductor layer;
first though third trenches penetrating through the base region and reaching to the first-conductivity-type semiconductor layer, the first through third trenches being linked to one another;
a source interconnect layer buried in the first through third trenches, the source interconnect layer comprising a protruding portion protruding from an upper end of the second trench;
a gate electrode buried in the first trench and the third trench, and formed over the source interconnect layer;
a source metal contacting the protruding portion of the source interconnect layer; and
a gate metal contacting the gate electrode in the third trench,wherein a contact face between the source metal and the protruding portion at the second trench is higher than a contact face between the gate metal and the gate electrode at the third trench.
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Accused Products
Abstract
A semiconductor device includes a first-conductivity-type semiconductor layer, a base region of a second-conductivity-type formed in an upper portion of the first-conductivity-type semiconductor layer, first though third trenches penetrating through the base region and reaching to the first-conductivity-type semiconductor layer, the first through third trenches being linked to one another, a source interconnect layer buried in the first through third trenches, the source interconnect layer including a protruding portion, a gate electrode buried in the first trench and the third trench, and formed over the source interconnect layer, a source metal contacting the protruding portion of the source interconnect layer, and a gate metal contacting the gate electrode in the third trench. A contact face between the source metal and the protruding portion at the second trench is formed higher than a contact face between the gate metal and the gate electrode at the third trench.
12 Citations
10 Claims
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1. A semiconductor device, comprising:
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a first-conductivity-type semiconductor layer; a base region of a second-conductivity-type formed in an upper portion of the first-conductivity-type semiconductor layer; first though third trenches penetrating through the base region and reaching to the first-conductivity-type semiconductor layer, the first through third trenches being linked to one another; a source interconnect layer buried in the first through third trenches, the source interconnect layer comprising a protruding portion protruding from an upper end of the second trench; a gate electrode buried in the first trench and the third trench, and formed over the source interconnect layer; a source metal contacting the protruding portion of the source interconnect layer; and a gate metal contacting the gate electrode in the third trench, wherein a contact face between the source metal and the protruding portion at the second trench is higher than a contact face between the gate metal and the gate electrode at the third trench. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification