Nearfield testing architecture

• US 8,750,354 B1
• Filed: 05/10/2011
• Issued: 06/10/2014
• Est. Priority Date: 05/10/2011
• Status: Active Grant

• Current Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Original Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Inventors: Uscinowicz, Michael, Arlow, Gregory A., Tanjutco, Fred, Heruska, William M.
• Primary Examiner(s): Bocure, Tesfaldet
• Application Number:
  US13/104,362
• Time in Patent Office: 1,127 Days
• Field of Search: 375/224, 375/228, 324/750.02, 324/750.19, 343/703, 343/893, 455/67.16, 702/118
• US Class Current: 375/224
• CPC Class Codes: H01Q 3/267 Phased-array testing or checking devices
• CPC Class Codes: H04B 5/70 specially adapted for specific purposes
• CPC Class Codes: H04B 5/73 for taking measurements, e.g. using sensing coils

Abstract

An open architecture design for a digital nearfield test system for nearfield testing of a phased array antenna allows the ability to use the components of an individual phased array antenna to be tested in conjunction with a nearfield scanner probe system allowing an efficient and cost-saving “radar testing the radar” scenario.

Claims

1. A digital nearfield testing architecture for nearfield testing of a digital phased array antenna under test, wherein the digital phased array antenna comprises a digital receiver/exciter and an onboard processor, the digital nearfield architecture comprising:

a digital nearfield scanner probe system comprising;

a nearfield scanner probe connected to the digital receiver/exciter and the onboard processor, wherein when the phased array antenna under test is in transmit mode, the nearfield scanner probe detects RF signal from the phased array antenna under test and sends detected receive (Rx) RF data to the digital receiver/exciter, and when the phased array antenna under test is in receive mode, the digital receiver/exciter generates and sends transmit (Tx) RF data to the digital nearfield scanner probe which then transmits an RF signal to the phased array antenna under test which generates digital I/Q data;

a data processing and array control unit; and

a local oscillator distribution network for synchronizing operations of the components of the digital nearfield architecture,

wherein the digital nearfield scanner probe system correlates the digital RF Tx and RF Rx data to the digital I/Q data from the phased array antenna under test.

2. The digital nearfield testing architecture of claim 1 further comprising an RF signal drift monitor loop between the nearfield scanner probe and the digital receiver/exciter for injecting RF signal back onto the nearfield scanner probe'"'"'s digital receiver/exciter.

3. The digital nearfield testing architecture of claim 1, wherein the digital receiver/exciter and the onboard processor formats the RF Rx data from the digital nearfield scanner probe and bus the RF Rx data back to the nearfield data processing and array control unit.