Test strip

• US 8,771,485 B2
• Filed: 01/30/2012
• Issued: 07/08/2014
• Est. Priority Date: 01/31/2011
• Status: Active Grant

• Current Assignee: Hmd Biomedical Inc.
• Original Assignee: Hmd Biomedical Inc.
• Inventors: Hsu, Tien-Tsai
• Primary Examiner(s): DIETERLE, JENNIFER M
• Application Number:
  US13/360,946
• Publication Number:
  US 20120193228A1
• Time in Patent Office: 890 Days
• Field of Search: 20440301-40315, 600380-583, 600/347, 205/792, 205/775, 205/778, 422/68.1, 422/82.01, 435/287.1
• US Class Current: 204/403.01
• CPC Class Codes: G01N 27/3272 Test elements therefor, i.e. disposable laminated substrates with electrodes, reagent and channels optical biosensors G01N33/52

Abstract

A test strip is revealed. The test strip includes a detection area, at least one outer sampling area, and a circuit system. The detection area includes a sampling hole, at least one sampling channel corresponding to the sampling hole, and at least one reaction area in the sampling channel. An inner sampling area is disposed around the sampling hole and an inner sampling opening is on an edge of the inner sampling area for communicating with the sampling channel and the sampling hole. The outer sampling area is located on an outer side of the test strip. The outer sampling area includes an outer sampling opening in communication with the sampling channel. The circuit system is electrically connected to the reaction area. The test strip further includes at least one pressing part located around the sampling hole for pressing against a test area and preventing cross-infection.

Claims

1. A test strip comprising:

a detection area having;

a sampling hole;

at least one sampling channel corresponding to the sampling hole;

at least one reaction area located in the sampling channel; and

at least one pressing part located around the sampling hole;

a circuit system electrically connected to the reaction area;

a substrate having a substrate hole;

a spacer layer disposed over the substrate, the spacer layer having a channel gap corresponding to the substrate hole;

an upper cover disposed over the spacer layer and having an upper cover hole; and

at least one inner sampling projection located between the sampling hole and the sampling channel, the inner sampling projection extending and projecting from an edge of the sampling channel to the sampling hole, the inner sampling projection comprising a substrate inner projection of the substrate and an upper-cover inner projection of the upper cover and the edge of the inner sampling projection having an inner sampling opening in communication with the sampling hole and the sampling channel;

wherein an overlapped area of the substrate hole, the channel gap and the upper cover hole is defined as the sampling hole, the sampling channel is formed among the channel gap, the substrate and the upper cover.

2. The test strip as claimed in claim 1, wherein the pressing part is disposed around the substrate hole, the channel gap or the upper cover hole.

3. The test strip as claimed in claim 1, wherein a diameter of the sampling hole ranges from 0.4 mm to 4 mm.

4. The test strip as claimed in claim 1, wherein a height of the pressing part ranges from 0.1 mm to 2 mm.

5. The test strip as claimed in claim 1, wherein a distance between a front end of the inner sampling projection and the center of the sampling hole ranges from 0.2 mm to 2 mm.

6. The test strip as claimed in claim 1, further including:

at least one positioning part defined as an insertion hole, a notch or a bump.

7. The test strip as claimed in claim 1, further including:

at least one outer sampling area located on an outer side of the test strip and communicated with the sampling channel.

8. A test strip comprising:

a detection area having;

a sampling hole;

at least one sampling channel corresponding to the sampling hole;

at least one reaction area located in the sampling channel; and

an inner sampling area disposed around the sampling hole and having an inner sampling opening on one edge thereof, the inner sampling opening communicated with the sampling hole and the sampling channel;

at least one outer sampling area located on an outer side of the test strip and having an outer sampling opening in communication with the sampling channel;

a circuit system electrically connected to the reaction area;

a substrate having a substrate hole;

a spacer layer disposed over the substrate and having a channel gap corresponding to the substrate hole; and

an upper cover disposed over the spacer layer and having an upper cover hole;

wherein an overlapped area of the substrate hole, the channel gap and the upper cover hole is defined as the sampling hole, the sampling channel is formed among the channel gap, the substrate and the upper cover;

the inner sampling area further includes;

at least one inner sampling projection located between the sampling hole and the sampling channel, the inner sampling projection extending and projecting from an edge of the sampling channel to the sampling hole, the inner sampling projection comprising a substrate inner projection of the substrate and an upper-cover inner projection of the upper cover and the inner sampling opening located at the edge of the inner sampling projection in communication with the sampling hole and the sampling channel.

9. The test strip as claimed in claim 8, wherein a distance between a front end of the inner sampling projection and the center of the sampling hole ranges from 0.2 mm to 2 mm.

10. The test strip as claimed in claim 8, wherein the upper cover hole and the substrate hole are different diameters, the inner sampling area is formed between the upper cover hole and the substrate hole.

11. The test strip as claimed in claim 8, wherein a diameter of the sampling hole ranges from 0.4 mm to 4 mm.

12. The test strip as claimed in claim 8, further including:

at least one pressing part disposed around the sampling hole.

13. The test strip as claimed in claim 8, further including:

at least one positioning part defined as an insertion hole, a notch or a bump.

14. The test strip as claimed in claim 8, wherein the outer sampling area further includes:

an outer sampling projection that is mounted with the outer sampling opening.