Semiconductor device
First Claim
1. A semiconductor device comprising:
- a gate electrode layer;
a gate insulating layer over the gate electrode layer;
a first oxide semiconductor layer over the gate electrode layer with the gate insulating layer interposed therebetween;
a second oxide semiconductor layer on the first oxide semiconductor layer;
a source electrode layer and a drain electrode layer over and electrically connected to the second oxide semiconductor layer,wherein the first oxide semiconductor layer comprises indium and zinc,wherein the second oxide semiconductor layer comprises indium and zinc,wherein the second oxide semiconductor layer comprises a first crystalline region,wherein the first crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the second oxide semiconductor layer,wherein the first oxide semiconductor layer comprises a second crystalline region, andwherein the second crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the first oxide semiconductor layer.
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Accused Products
Abstract
An embodiment is a semiconductor device which includes a first oxide semiconductor layer over a substrate having an insulating surface and including a crystalline region formed by growth from a surface of the first oxide semiconductor layer toward an inside; a second oxide semiconductor layer over the first oxide semiconductor layer; a source electrode layer and a drain electrode layer which are in contact with the second oxide semiconductor layer; a gate insulating layer covering the second oxide semiconductor layer, the source electrode layer, and the drain electrode layer; and a gate electrode layer over the gate insulating layer and in a region overlapping with the second oxide semiconductor layer. The second oxide semiconductor layer is a layer including a crystal formed by growth from the crystalline region.
235 Citations
65 Claims
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1. A semiconductor device comprising:
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a gate electrode layer; a gate insulating layer over the gate electrode layer; a first oxide semiconductor layer over the gate electrode layer with the gate insulating layer interposed therebetween; a second oxide semiconductor layer on the first oxide semiconductor layer; a source electrode layer and a drain electrode layer over and electrically connected to the second oxide semiconductor layer, wherein the first oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises a first crystalline region, wherein the first crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the second oxide semiconductor layer, wherein the first oxide semiconductor layer comprises a second crystalline region, and wherein the second crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the first oxide semiconductor layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A semiconductor device comprising:
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a first oxide semiconductor layer; a second oxide semiconductor layer on the first oxide semiconductor layer; a source electrode layer and a drain electrode layer over and electrically connected to the second oxide semiconductor layer; a gate insulating layer over the second oxide semiconductor layer, the source electrode layer, and the drain electrode layer; a gate electrode layer over the second oxide semiconductor layer with the gate insulating layer interposed therebetween, wherein the first oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises a first crystalline region, wherein the first crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the second oxide semiconductor layer, wherein the first oxide semiconductor layer comprises a second crystalline region, and wherein the second crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the first oxide semiconductor layer. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32)
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33. A semiconductor device comprising:
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a first gate electrode layer; a first gate insulating layer over the first gate electrode layer; a first oxide semiconductor layer over the first gate electrode layer with the first gate insulating layer interposed therebetween; a second oxide semiconductor layer on the first oxide semiconductor layer; a source electrode layer and a drain electrode layer over and electrically connected to the second oxide semiconductor layer, a second gate insulating layer over the second oxide semiconductor layer, the source electrode layer, and the drain electrode layer, a second gate electrode layer over the first gate electrode layer with the second gate insulating layer interposed therebetween, wherein the first oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises a first crystalline region, and wherein the first crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the second oxide semiconductor layer. - View Dependent Claims (34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51)
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52. A semiconductor device comprising:
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a gate electrode layer; a first oxide semiconductor layer adjacent to the gate electrode layer with a gate insulating layer interposed therebetween; a second oxide semiconductor layer on the first oxide semiconductor layer; a source electrode layer and a drain electrode layer over and electrically connected to the second oxide semiconductor layer, wherein the first oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises indium and zinc, wherein the second oxide semiconductor layer comprises a crystalline region, wherein the crystalline region has a c-axis aligned in a direction substantially perpendicular to a surface of the second oxide semiconductor layer, wherein the crystalline region comprises a layer parallel with an a-axis and a b-axis of the crystalline region, and wherein the layer comprises indium. - View Dependent Claims (53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65)
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Specification