Imaging system and method using partial-coherence speckle interference tomography
First Claim
1. A system for imaging a contoured surface comprising:
- a light source configured to project a beam of partially coherent electromagnetic radiation onto the contoured surface, wherein the projected beam-generates first radiation scattered from a first portion of the contoured surface to form a speckle pattern, and second radiation scattered from a second portion of the contoured surface to form a pattern which is substantially uniform in intensity;
an optical detector configured to receive the first and second scattered radiation from the contoured surface, wherein a coherence length of the light source is greater than a depth of the first portion of the contoured surface and less than a depth of the second portion of the contoured surface, when imaged within a single pixel of the optical detector; and
a processor configured to (1) generate a plurality of images from the first and second scattered radiation, with each image being generated using different coherence length electromagnetic radiation from the light source, and (2) generate a 3-D image of the contoured surface from the plurality of images.
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Abstract
A system for generating an image of contoured surface includes a light source that is configured to project an electromagnetic radiation beam onto the contoured surface, wherein the projected beam generates first radiation reflected from a first portion of the contoured surface to form a speckle pattern, and second radiation reflected from a second portion of the contoured surface which is substantially uniform in intensity. The reflected first and second reflected radiation is received by an optical detector, and may be processed. The processing is configured to (1) generate a plurality of images from the first and second reflected radiation, with each image being generated using different coherence length electromagnetic radiation from the light source, and (2) generate a 3-D image of the contoured surface from the plurality of images. Methods for generating a 3-D image of a contoured surface are also disclosed.
41 Citations
20 Claims
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1. A system for imaging a contoured surface comprising:
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a light source configured to project a beam of partially coherent electromagnetic radiation onto the contoured surface, wherein the projected beam-generates first radiation scattered from a first portion of the contoured surface to form a speckle pattern, and second radiation scattered from a second portion of the contoured surface to form a pattern which is substantially uniform in intensity; an optical detector configured to receive the first and second scattered radiation from the contoured surface, wherein a coherence length of the light source is greater than a depth of the first portion of the contoured surface and less than a depth of the second portion of the contoured surface, when imaged within a single pixel of the optical detector; and a processor configured to (1) generate a plurality of images from the first and second scattered radiation, with each image being generated using different coherence length electromagnetic radiation from the light source, and (2) generate a 3-D image of the contoured surface from the plurality of images. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for imaging a contoured surface, comprising:
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generating a plurality of images by; projecting a beam of partially coherent electromagnetic radiation onto the contoured surface, wherein the projected beam generates first radiation scattered from a first portion of the contoured surface to form a speckle pattern, and second radiation scattered from a second portion of the contoured surface to form a pattern which is substantially uniform in intensity; and receiving, with an optical detector, the first and second scattered radiation from the contoured surface, wherein each image is generated using different coherence length electromagnetic radiation from the light source, wherein a coherence length of the light source is greater than a depth of the first portion of the contoured surface and less than a depth of the second portion of the contoured surface, when imaged within a single pixel of the optical detector, and generating, with a processor, a 3-D image of the contoured surface from the plurality of images. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification