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Probe assembly and methods for use in inspecting a component

  • US 8,786,300 B2
  • Filed: 02/07/2012
  • Issued: 07/22/2014
  • Est. Priority Date: 02/07/2012
  • Status: Expired due to Fees
First Claim
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1. A probe tip comprising:

  • a plurality of light emitters; and

    a control circuit coupled to said plurality of light emitters, said control circuit is configured to control a projection of a plurality of light patterns from said plurality of light emitters for performing an analysis of the plurality of light patterns using a plurality of images of the plurality of light patterns on a component being inspected, wherein said control circuit controls the projection of the plurality of light patterns by;

    receiving electrical energy from a drive circuit;

    identifying at least one of said plurality of light emitters for receiving a power input based at least in part on the received electrical energy; and

    transmitting the power input to said at least one identified light emitter based at least in part on the received electrical energy to enable the activation of said at least one identified light emitter such that light is emitted therethrough.

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