Mode-synthesizing atomic force microscopy and mode-synthesizing sensing
First Claim
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1. A sensor system comprising:
- a first cantilever comprising a first end;
a first excitation source that applies to said first cantilever a first set of energies at a first set of frequencies;
a second cantilever comprising a second end, wherein said second end is adjacent to said first end;
a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies, wherein said first set of energies and said second set of energies are simultaneously applied to said first cantilever and said second cantilever, respectively, and form a multi-mode coupling; and
a detector that detects an effect of said multi-mode coupling.
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Abstract
A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.
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Citations
9 Claims
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1. A sensor system comprising:
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a first cantilever comprising a first end; a first excitation source that applies to said first cantilever a first set of energies at a first set of frequencies; a second cantilever comprising a second end, wherein said second end is adjacent to said first end; a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies, wherein said first set of energies and said second set of energies are simultaneously applied to said first cantilever and said second cantilever, respectively, and form a multi-mode coupling; and a detector that detects an effect of said multi-mode coupling. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of analyzing a sample comprising:
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applying a first set of energies at a first set of frequencies to a sample via a first cantilever; applying a second set of energies at a second set of frequencies to said sample via a second cantilever, wherein said first cantilever is adjacent to said second cantilever, wherein said first set of energies and said second set of energies are simultaneously applied to said first cantilever and said second cantilever, respectively, and form a multi-mode coupling; and detecting an effect of said multi-mode coupling. - View Dependent Claims (8, 9)
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Specification