System and method for wirelessly testing integrated circuits
First Claim
1. A wireless testing structure for an integrated circuit, comprising:
- a wireless transceiver configured to receive test information from a tester and transmit test result information to the tester; and
a wireless test interface configured to interface between the wireless transceiver and the integrated circuit, the wireless test interface comprising;
a media access controller configured to implement a media access control protocol for wireless communication; and
a test control block configured to decode test information received from the tester, to trigger a number of different types of tests of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test; and
a test control block including a comparator configured to compare the test result information generated by the integrated circuit with a comparison vector and to produce a comparison result as the test result information.
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Accused Products
Abstract
A system and method for wirelessly testing integrated circuits provides a multiple layer interface to wirelessly test integrated circuits. A wireless testing structure for an integrated circuit comprises a wireless transceiver and a wireless test interface. The wireless transceiver is configured to receive test information from a tester and transmit test result information to the tester. The wireless test interface is configured to interface between the wireless transceiver and the integrated circuit. The wireless test interface comprises a media access controller and a test control block. The media access controller is configured to implement a media access control protocol for wireless communication. The test control block is configured to decode test information received from the tester, to trigger a test of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test.
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Citations
24 Claims
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1. A wireless testing structure for an integrated circuit, comprising:
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a wireless transceiver configured to receive test information from a tester and transmit test result information to the tester; and a wireless test interface configured to interface between the wireless transceiver and the integrated circuit, the wireless test interface comprising; a media access controller configured to implement a media access control protocol for wireless communication; and a test control block configured to decode test information received from the tester, to trigger a number of different types of tests of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test; and a test control block including a comparator configured to compare the test result information generated by the integrated circuit with a comparison vector and to produce a comparison result as the test result information. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method for wirelessly testing an integrated circuit comprising:
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wirelessly transmitting test information to at least one integrated circuit using a media access control protocol; wirelessly receiving test information using the media access control protocol; decoding the test information and triggering a number of different types of test of the integrated circuit in response to the decoded test information; encoding test result information that is generated by the integrated circuit in response to the test; comparing the test result information generated by the integrated circuit with a comparison vector and producing a comparison result as the test result information; and wirelessly transmitting the encoded test result information using the media access control protocol. - View Dependent Claims (11, 12, 13)
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14. A wireless testing structure for an integrated circuit, comprising:
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a wireless transceiver configured to receive test information from a tester and transmit test result information to the tester; and a wireless test interface configured to interface between the wireless transceiver and the integrated circuit, the wireless test interface comprising; a media access controller configured to implement a media access control protocol for wireless communication, wherein the media access control protocol is configured to support broadcast, multicast, and unicast modes;
the media access control protocol being used in the multicast mode to establish groups that allow the tester to exclude faulty integrated circuits by assigning them to at least one group according to their fault type, or to test a heterogeneous wafer by assigning each type of integrated circuit to a specific group, the media access control protocol being used in the unicast mode to enable the tester to communicate individually with one integrated circuit to conduct single integrated circuit testing; anda test control block configured to decode test information received from the tester, to trigger a number of different types of tests of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test; and a test control block including a comparator configured to compare the test result information generated by the integrated circuit with a comparison vector and to produce a comparison result as the test result information. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21)
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22. A method for wirelessly testing an integrated circuit comprising:
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wirelessly transmitting test information to at least one integrated circuit using a media access control protocol, wherein the media access control protocol supports broadcast, multicast, and unicast modes;
the media access control protocol being used in the multicast mode to establish groups that allow the tester to exclude faulty integrated circuits by assigning them to at least one group according to their fault type, or to test a heterogeneous wafer by assigning each type of integrated circuit to a specific group;
the media access control protocol being used in the unicast mode to enable the tester to communicate individually with one integrated circuit to conduct single integrated circuit testing;wirelessly receiving test information using the media access control protocol; decoding the test information and triggering a number of different types of test of the integrated circuit in response to the decoded test information; encoding test result information that is generated by the integrated circuit in response to the test; comparing the test result information generated by the integrated circuit with a comparison vector and producing a comparison result as the test result information; and wirelessly transmitting the encoded test result information using the media access control protocol. - View Dependent Claims (23, 24)
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Specification