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Temperature-measurement probe

  • US 8,794,829 B2
  • Filed: 12/31/2009
  • Issued: 08/05/2014
  • Est. Priority Date: 12/31/2009
  • Status: Expired due to Fees
First Claim
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1. A temperature-measurement device, comprising:

  • a first separately designed and manufactured device;

    a first path residing within said first separately designed and manufactured device including a communication node, said first path generating circuit measurement data and including a memory configured to store a procedural model; and

    a second path in communication with said communication node to receive said procedural model and said circuit measurement data from said first path to provide an estimated target temperature, andwherein said procedural model having a script for correlating said circuit-measurement data to provide the estimated target temperature, andwherein the second path having processing circuitry configured to process a customized script from a second separately designed and manufactured device interchangeable with the first separately designed and manufactured device, the customized script having programming constructs different from the script of the first separately designed and manufactured device.

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