Semiconductor device and manufacturing method thereof
First Claim
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1. A manufacturing method of a semiconductor device, comprising the steps of:
- forming a gate electrode over a substrate;
forming a semiconductor film comprising an oxide semiconductor over the substrate; and
heating the gate electrode and the oxide semiconductor by irradiation of light to increase crystallinity in the oxide semiconductor,wherein the semiconductor film is adjacent to the gate electrode with an insulating film interposed therebetween, andwherein the oxide semiconductor is In—
Ga—
Zn—
O based oxide semiconductor,wherein the semiconductor film comprises a first region and a second region,wherein the gate electrode is closer to the first region than the second region, andwherein a crystallinity of the first region is higher than a crystallinity of the second region.
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Abstract
An object is to provide a semiconductor device of which a manufacturing process is not complicated and by which cost can be suppressed, by forming a thin film transistor using an oxide semiconductor film typified by zinc oxide, and a manufacturing method thereof. For the semiconductor device, a gate electrode is formed over a substrate; a gate insulating film is formed covering the gate electrode; an oxide semiconductor film is formed over the gate insulating film; and a first conductive film and a second conductive film are formed over the oxide semiconductor film. The oxide semiconductor film has at least a crystallized region in a channel region.
625 Citations
33 Claims
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1. A manufacturing method of a semiconductor device, comprising the steps of:
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forming a gate electrode over a substrate; forming a semiconductor film comprising an oxide semiconductor over the substrate; and heating the gate electrode and the oxide semiconductor by irradiation of light to increase crystallinity in the oxide semiconductor, wherein the semiconductor film is adjacent to the gate electrode with an insulating film interposed therebetween, and wherein the oxide semiconductor is In—
Ga—
Zn—
O based oxide semiconductor,wherein the semiconductor film comprises a first region and a second region, wherein the gate electrode is closer to the first region than the second region, and wherein a crystallinity of the first region is higher than a crystallinity of the second region. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A manufacturing method of a semiconductor device, comprising the steps of:
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forming a gate electrode over a substrate; forming a wiring over the substrate; forming a semiconductor film comprising an oxide semiconductor over the substrate; and heating the gate electrode and the oxide semiconductor by irradiation of light to increase crystallinity in the oxide semiconductor, wherein the semiconductor film is adjacent to the gate electrode with an insulating film interposed therebetween, wherein the insulating film has single layer or multiple layer, wherein the oxide semiconductor is In—
Ga—
Zn—
O based oxide semiconductor,wherein the semiconductor film comprises a first region and a second region, wherein the gate electrode is closer to the first region than the second region, and wherein a crystallinity of the first region is higher than a crystallinity of the second region. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A manufacturing method of a semiconductor device, comprising the steps of:
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forming a gate electrode over a substrate; forming a semiconductor film comprising an oxide semiconductor over the substrate, wherein the semiconductor film has a thickness of 25 to 200 nm; forming a wiring over the substrate; and heating the gate electrode and the oxide semiconductor by irradiation of light to increase crystallinity in the oxide semiconductor, wherein the semiconductor film is adjacent to the gate electrode with an insulating film interposed therebetween, wherein the oxide semiconductor is In—
Ga—
Zn—
O based oxide semiconductor,wherein the semiconductor film comprises a first region and a second region, wherein the gate electrode is closer to the first region than the second region, and wherein a crystallinity of the first region is higher than a crystallinity of the second region. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29)
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30. A manufacturing method of a semiconductor device, comprising the steps of:
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forming a gate electrode over a substrate; forming a semiconductor film comprising an oxide semiconductor over the substrate; and heating the gate electrode at 250°
C. to 570°
C. to improve crystallinity of a channel region of the semiconductor film,wherein the semiconductor film is adjacent to the gate electrode with an insulating film interposed therebetween, wherein the oxide semiconductor is In—
Ga—
Zn—
O based oxide semiconductor,wherein the semiconductor film comprises a first region and a second region, wherein the gate electrode is closer to the first region than the second region, and wherein a crystallinity of the first region is higher than a crystallinity of the second region. - View Dependent Claims (31, 32, 33)
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Specification