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Parallel test payload

  • US 8,797,193 B2
  • Filed: 01/29/2010
  • Issued: 08/05/2014
  • Est. Priority Date: 01/29/2010
  • Status: Active Grant
First Claim
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1. A parallel test payload, comprising:

  • a bit sequence configured to be segmented into a plurality of sub-sequences having variable bit length carriers; and

    each of the plurality of sub-sequences including;

    respective carriers represented uniformly in a respective sub-sequence such that each of the respective carriers is present an equal number of times in the respective sub-sequence; and

    a number of bits present in each of the respective carriers such that each of the respective carriers in the respective sub-sequence has a bit length that is different than a bit length of any other respective carriers in any other respective sub-sequences;

    wherein the bit sequence is represented in each of the plurality of sub-sequences through the respective carriers.

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