Providing signals to electronic connectors
First Claim
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1. A method comprising:
- while a test system connector remains connected to an input port of a mobile device having a display, a memory, and a processor, performing a first simulation comprising;
providing one or more data connector power signals to the mobile device via the test system connector;
simulating a connector insertion delay that occurs when a connector is inserted into the input port of the mobile device, the connector insertion delay caused by the physical layout of corresponding conductors in the input port of the mobile device and the connector; and
providing, after the simulated connector insertion delay, one or more data connector data signals to the mobile device via the test system connector,wherein different speeds at which the test system connector and the input port of the mobile device can be physically connected together are simulated by varying the simulated connector insertion delay such that a longer simulated connector insertion delay simulates a slower speed of physically bringing the test system connector and the input port of the mobile device together and a shorter simulated connector insertion delay simulates a faster speed of physically bringing the test system connector and the input port of the mobile device together.
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Abstract
A connector can be activated or deactivated by providing power and data signals to the connector at different times. In some embodiments, the power signals are provided to a connector, and then the data signals are provided to the connector after a delay. Providing power and data signals at different times can, in at least some cases, better mimic the timing of signals provided by a connector as the connector is attached to an electronic device. This can aid automated testing of the electronic device. It can also be used to control access of the device through the connector.
32 Citations
17 Claims
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1. A method comprising:
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while a test system connector remains connected to an input port of a mobile device having a display, a memory, and a processor, performing a first simulation comprising; providing one or more data connector power signals to the mobile device via the test system connector; simulating a connector insertion delay that occurs when a connector is inserted into the input port of the mobile device, the connector insertion delay caused by the physical layout of corresponding conductors in the input port of the mobile device and the connector; and providing, after the simulated connector insertion delay, one or more data connector data signals to the mobile device via the test system connector, wherein different speeds at which the test system connector and the input port of the mobile device can be physically connected together are simulated by varying the simulated connector insertion delay such that a longer simulated connector insertion delay simulates a slower speed of physically bringing the test system connector and the input port of the mobile device together and a shorter simulated connector insertion delay simulates a faster speed of physically bringing the test system connector and the input port of the mobile device together. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A universal serial bus (USB) device test apparatus comprising:
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a first circuit configured to provide power to a USB device test connector responsive to an input signal; a second circuit configured to provide a data plus signal and a data minus signal to the USB device test connector responsive to a delayed version of the input signal; and a time delay circuit configured to receive the input signal and to produce the delayed version of the input signal to which the second circuit is responsive, the time delay circuit being configurable to vary a delay between the input signal being provided to the first circuit and the delayed version of the input signal, wherein the delay mimics a USB connector insertion delay that occurs when establishing a connection of the USB device test apparatus to a USB device without physically disconnecting and reconnecting the USB device test apparatus and the USB device, wherein different speeds at which the USB device test apparatus and the USB device can be physically connected together are simulated by varying the delay such that a longer delay simulates a slower speed of physically bringing the USB device test apparatus and the USB device together and a shorter delay simulates a faster speed of physically bringing the USB device test apparatus and the USB device together. - View Dependent Claims (8, 9, 10, 11)
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12. One or more computer storage devices storing computer-executable instructions that, when executed by a computing device, cause the computing device to perform a method, the method comprising:
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while a test system connector remains connected to an input port of a mobile device having a display, a memory, and a processor, performing a simulation comprising; providing a first set of one or more signals to the mobile device via the test system connector, the first set of one or more signals comprising one or more data connector power signals; selecting a connector insertion delay that follows the providing the first set of one or more signals, wherein the length of the selected connector insertion delay simulates, without physically disconnecting and reconnecting the test system connector and the input port of the mobile device, a delay that would occur when the test system connector and the input port of the mobile device are actually physically brought together at a particular speed; and providing, after the selected connector insertion delay following the providing of the first set of one or more signals, a second set of one or more signals to the mobile device, the second set of one or more signals comprising one or more data connector data signals, wherein different speeds at which the test system connector and the input port of the mobile device can be physically connected together are simulated by varying the selected connector insertion delay such that a longer selected connector insertion delay simulates a slower speed of physically bringing the test system connector and the input port of the mobile device together and a shorter selected connector insertion delay simulates a faster speed of physically bringing the test system connector and the input port of the mobile device together.
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13. A multi-device test system comprising:
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a control unit configured to test a plurality of battery-powered devices, the respective battery-powered devices having a USB input port; a plurality of test circuits, each of the respective test circuits being configured to test a respective one of the plurality of battery-powered devices and comprising; a first circuit configured to provide power to a USB device test connector responsive to an input signal from the control unit; a second circuit configured to provide a data plus signal and a data minus signal to the USB device test connector responsive to a delayed version of the input signal; and a time delay circuit configured to receive the input signal and, using a delay, produce the delayed version of the input signal to which the second circuit is responsive, wherein the delay simulates a USB connector insertion delay that occurs when establishing a connection between the USB device test connector and the USB input port of the battery-powered device, and wherein simulating the USB connector insertion delay using the time delay circuit allows simulation of the USB connector insertion delay without physically disconnecting and reconnecting the USB device test connector and the battery-powered device, wherein different speeds at which the USB device test connector and the USB input port can be physically connected together are simulated by varying the delay such that a longer delay simulates a slower speed of physically bringing the USB device test connector and the USB input port together and a shorter delay simulates a faster speed of physically bringing the USB device test connector and the USB input port together; and a multiplexer that communicates test commands from the control unit to the plurality of test circuits. - View Dependent Claims (14, 15, 16, 17)
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Specification