Dimensional probe and methods of use

• US 8,810,800 B2
• Filed: 03/23/2009
• Issued: 08/19/2014
• Est. Priority Date: 03/22/2008
• Status: Active Grant

• Current Assignee: Lyle G. Shirley
• Original Assignee: Lyle G. Shirley
• Inventors: Shirley, Lyle G.
• Primary Examiner(s): Toatley, Gregory J
• Assistant Examiner(s): ALLI, IYABO
• Application Number:
  US12/921,185
• Publication Number:
  US 20110013198A1
• Time in Patent Office: 1,975 Days
• Field of Search: 356/243.1, 356601-610, 356/37, 385 4- 27
• US Class Current: 356/610
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50
• CPC Class Codes: G02B 27/48 Laser speckle optics

Abstract

Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.

Claims

1. A surface sensing apparatus, said apparatus comprising:

at least one source of coherent radiation capable of outputting at least one wavelength emission to create a first illumination state and to illuminate a surface to create a first speckle pattern;

an emission deviation facility capable of influencing the emission to illuminate the surface to create a second illumination state, a second speckle pattern and a speckle shift; and

at least one sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern.

2. The surface sensing apparatus of claim 1 further comprising a waist creating assembly capable of influencing the emission to create at least one illumination waist location and the emission deviation facility is further capable of influencing the at least one illumination waist location to create the first and second speckle pattern.

3. The surface sensing apparatus of claim 1 wherein the emission deviation facility further comprises the at least one source of coherent radiation being capable of emitting a first and a second wavelength emission to create a first and second illumination state and create the first and second speckle pattern.

4. The surface sensing apparatus of claim 1 wherein the emission deviation facility further comprises a waist offset creating assembly capable of creating a waist offset and changing the waist offset to create the first and second speckle pattern.

5. The surface sensing apparatus of claim 1 wherein the emission deviation facility further comprises:

a waist offset creating assembly capable of creating a waist offset and changing the waist offset to create the first and second speckle pattern; and

a deflector assembly capable of altering a direction of the illumination state.

6. The surface sensing apparatus of claim 1 wherein the emission deviation facility further comprises a waist range offset assembly capable of creating a waist range offset and changing the waist range offset to create the first and second speckle pattern.

7. The surface sensing apparatus of claim 1, further comprising:

a processor in communication with a memory and the at least one sensor;

the processor capable of receiving a representation of the first and second speckle pattern; and

the memory containing machine instructions capable of determining the speckle shift from the speckle patterns whereby the processor can calculate at least one system parameter comprising one of a surface height or surface-orientation information.

8. A surface sensing apparatus, said apparatus comprising:

at least one source of coherent radiation capable of outputting at least one wavelength emission to illuminate a surface;

a relative position of the surface and the emission being variable to create a first surface state and second surface state, each surface state having a speckle pattern;

the relative position of the surface and the emission being variable to create a speckle shift; and

at least one sensor capable of sensing a representation of a first and a second speckle intensity from the first and second speckle pattern.

9. The surface sensing apparatus of claim 8 further comprising a surface deviation facility capable of varying the position of an object having the surface whereby the varying the position of the object varies the relative position of the surface and the emission.

10. The surface sensing apparatus of claim 8 further comprising a range change assembly capable of varying the relative position of the surface and the emission by a range.

11. The surface sensing apparatus of claim 8 further comprising a lateral translation assembly capable of varying the relative position of the surface and the emission by a lateral translation.

12. The surface sensing apparatus of claim 8, further comprising:

a processor in communication with a memory and the at least one sensor;

the processor capable of receiving a representation of the first and second speckle pattern; and

the memory containing machine instructions capable of determining the speckle shift from the speckle patterns whereby the processor can calculate at least one system parameter.

13. A method of sensing properties of a surface, said method comprising:

illuminating a surface with at least one source of coherent radiation emission with a first illumination state;

sensing a first speckle intensity from the surface from the first illumination state;

influencing the emission to create a second illumination state;

sensing a second speckle intensity from the surface from the second illumination state; and

determining a speckle shift between the first and second speckle intensity.

14. The method of claim 13 further comprising:

calculating at least one surface parameter using the speckle shift.

15. The method of claim 14 wherein:

the first and second illumination state have a first and second waist;

a difference between the first and second waist comprising a waist offset; and

the step of calculating the at least one surface parameter comprises calculating a surface height using the speckle shift and the waist offset.

16. The method of claim 15 wherein:

each illumination state having a direction and a difference between the first and second illumination direction is an illumination direction offset; and

the step of calculating the surface height further comprises using the speckle shift, the waist offset and the illumination direction offset.

17. The method of claim 14 wherein:

the step of illuminating the surface with at least one source of coherent radiation comprises at least two emissions, each emission having a wavelength;

the difference between each wavelength is a wavelength change; and

the step of calculating the surface parameters comprises calculating surface orientation information of the surface using the speckle shift and the wavelength change.

18. A method of sensing properties of a surface, said method comprising:

illuminating a surface with at least one source of coherent radiation emission;

the surface having a first surface state;

sensing a first speckle intensity from the surface at the first surface state;

influencing a relationship of the surface to the emission to create a second surface state;

sensing a second speckle intensity from the surface at the second surface state; and

determining at least one surface parameter using a speckle shift between the first and second surface state.

19. The method of claim 18 wherein the at least one surface parameter comprises one of surface orientation information, surface orientation change information, or lateral translation.

20. The method of claim 18 further comprising:

the step of illuminating the surface with at least one source of coherent radiation emission is performed at a first range;

the step of influencing the relationship of the surface to the emission to create a second surface state comprises moving the relationship of the surface and the emission to create a second range; and

calculating surface orientation information using a speckle shift between the first and second surface state.

21. The method of claim 18 further comprising:

the step of illuminating the surface with at least one source of coherent radiation emission is performed at a first surface orientation;

the step of influencing the relationship of the surface to the emission to create a second surface state comprises moving the relationship of the surface and the emission to create a second surface orientation; and

calculating a change between the first and second surface orientation using a speckle shift between the first and second surface state.

22. The method of claim 18 further comprising:

the step of illuminating the surface with at least one source of coherent radiation emission is performed at a first lateral location;

the step of influencing the relationship of the surface to the emission to create a second surface state comprises moving a relationship of the surface and the emission to create a second lateral location; and

calculating a change between the first and second lateral location using a speckle shift between the first and second surface state.

24. The method of claim 18 further comprising:

determining an azimuthal component of the surface-orientation information from a direction of the speckle shift; and

creating an indicator of the alignment of the surface normal to a direction.

23. A method of creating a plurality of speckle patterns, the method comprising the steps of:

illuminating a surface with at least one source of coherent radiation emission with a first illumination state having a waist to create a first speckle pattern; and

influencing the emission to create a second illumination state having a second waist, a second speckle pattern and a speckle shift.