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Digitally controlled jitter injection for built in self-testing (BIST)

  • US 8,811,458 B2
  • Filed: 10/04/2012
  • Issued: 08/19/2014
  • Est. Priority Date: 10/04/2012
  • Status: Expired due to Fees
First Claim
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1. An apparatus, comprising:

  • a transceiver circuit comprising;

    a transmitter circuit configured to transmit a signal;

    a receiver circuit configured to receive the signal;

    a generator configured to generate a composite jitter including a plurality of multi-tone jitter components; and

    a processor operable to digitally inject the composite jitter into the receiver circuit and/or the transmitter circuit of the transceiver circuit for testing a jitter tolerance associated with the transceiver circuit based on the signal and the injected composite jitter.

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