Methods and apparatus for insitu analysis of gases in electronic device fabrication systems
First Claim
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1. A method for testing a sample gas comprising:
- adjusting a pressure level of a sample gas; and
determining a composition of the adjusted sample gas;
wherein the adjusting includes adjusting the pressure level from a low pressure at which measurement by spectroscopy would not be accurate to a higher pressure within a high enough suitable range at which the composition of the sample gas is capable of being accurately determined by spectroscopy; and
wherein adjusting the pressure level includes;
adding additional sample gas to the sample gas in an isolatable chamber; and
controlling a booster pump and a variable outlet orifice.
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Abstract
Systems and methods are disclosed that include adjusting a pressure level of a sample gas in a testing chamber, for example, using a pressurized inert reference gas, and determining a composition of the adjusted sample gas. By adjusting the pressure level of the sample gas, the composition of the sample gas may be determined more accurately than otherwise possible. Numerous other aspects are disclosed.
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Citations
8 Claims
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1. A method for testing a sample gas comprising:
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adjusting a pressure level of a sample gas; and determining a composition of the adjusted sample gas; wherein the adjusting includes adjusting the pressure level from a low pressure at which measurement by spectroscopy would not be accurate to a higher pressure within a high enough suitable range at which the composition of the sample gas is capable of being accurately determined by spectroscopy; and wherein adjusting the pressure level includes; adding additional sample gas to the sample gas in an isolatable chamber; and controlling a booster pump and a variable outlet orifice. - View Dependent Claims (2, 3, 4)
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5. A system for testing sample gases comprising:
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a processing tool having a plurality of isolatable spaces containing gases to be tested; a measurement device comprising a chamber adapted to contain a sample gas to be tested; a fitting for selectively coupling the chamber to the plurality of spaces; a controller adapted to adjust a pressure level of the sample gas in the chamber;
wherein the adjustment includes adjusting the pressure level from a low pressure at which measurement by spectroscopy would not be accurate to a higher pressure within a high enough suitable range at which a composition of the sample gas is capable of being accurately determined by spectroscopy; andwherein the controller is coupled to a sample gas supply and a booster pump. - View Dependent Claims (6, 7, 8)
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Specification