Instrumentation and method for optical measurement of samples

• US 8,814,427 B2
• Filed: 10/13/2009
• Issued: 08/26/2014
• Est. Priority Date: 01/26/2009
• Status: Active Grant

• Current Assignee: Wallac Oy (Revvity, Inc.)
• Original Assignee: Wallac Oy (Revvity, Inc.)
• Inventors: Laitinen, Jyrki, Ojala, Markku
• Primary Examiner(s): KAPLAN VERBITSKY, GAIL
• Application Number:
  US13/146,290
• Publication Number:
  US 20120027044A1
• Time in Patent Office: 1,778 Days
• Field of Search: 374/120, 374/121, 374/124, 374/129, 374130-132, 374/1, 374 10- 12, 374/30, 250/240, 250/341.1, 250/341.5, 250/341.6, 250/342, 250/338.1, 250/341.8, 356/43, 356/614, 356/445, 356/434, 356/246
• US Class Current: 374/131
• CPC Class Codes: G01N 21/253 for batch operation, i.e. multisample apparatus analytical automats G01N35/00
• CPC Class Codes: G01N 21/6452 Individual samples arranged in a regular 2D-array, e.g. multiwell plates
• CPC Class Codes: G01N 2201/1211 for temperature

Abstract

An optical measurement instrument includes one or more temperature sensors (122) arranged to measure sample well specific temperatures from sample wells (111-117) arranged to store samples (103-109) to be optically measured. A processing device (121) of the optical measurement instrument is arranged to correct, using a pre-determined mathematical rule, measurement results obtained by the optical measurements on the basis of the measured sample well specific temperatures. Hence, the adverse effect caused by temperature differences between different samples on the accuracy of the temperature correction of the measurement results is mitigated.

Claims

1. An optical measurement instrument comprising:

at least one excitation light source (101, 102) each of which being arranged to produce an excitation beam for at least one of samples (103-109, 203-210) to be measured, each sample to be measured being stored in one of a plurality of sample wells (111-117),

at least one detector (119, 120) each of which being arranged to detect an emission beam emitted by one of the samples to be measured and to produce a detection signal responsive to the detected emission beam,

a processing device (121) for producing a measurement result for each sample to be measured on the basis of the detection signal related to that sample, and

at least one temperature sensor (122) arranged to measure sample well specific temperatures from the sample wells, the at least one temperature sensor being capable of measuring different temperatures from different sample wells, and the processing device is arranged to correct the measurement result related to each sample to be measured on the basis of the sample well specific temperature measured from the particular sample well containing that sample,

wherein the plurality of the sample wells (111-117) are movable with respect to the at least one temperature sensor (122) so as to enable each temperature sensor to measure the sample well specific temperatures from more than one sample well, and the at least one temperature sensor is arranged to measure the sample well specific temperature from a particular one of the sample wells (112) that is in such a mechanical position that the detector (119, 120) is able to detect the emission beam emitted by the sample stored in that particular sample well.

2. The optical measurement instrument according to claim 1, wherein the temperature sensor is arranged to measure the sample well specific temperature during a time interval when the detector is detecting the emission beam from the sample stored in the corresponding sample well.

3. The optical measurement instrument according to claim 1, comprising an interface device (123, 223) for receiving a separate element (124, 224) including the plurality of the sample wells.

4. The optical measurement instrument according to claim 1, comprising an element including the plurality of the sample wells.

5. The optical measurement instrument according to claim 1, wherein the processing device is arranged to correct the measurement result related to each sample to be measured according to the following rule:

M_corr=M×

F(T),

wherein M_corr is the corrected measurement result, M is the measurement result, and F(T) is a pre-determined function of the sample well specific temperature T measured from the particular sample well containing the sample under consideration.

6. The optical measurement instrument according to claim 1, wherein the processing device is arranged to correct the measurement result related to each sample to be measured according to the following rule:

M_corr=M×

α

^(T0-T),

wherein M_corr is the corrected measurement result, M is the measurement result, α and

T₀ are predetermined constants, and T is the sample well specific temperature measured from the particular sample well containing the sample under consideration.

7. A method for making temperature corrections to measurement results taken with an optical measurement instrument that comprises:

at least one excitation light source each of which being arranged to produce an excitation beam for at least one of samples to be measured, each sample to be measured being stored in one of a plurality of sample wells,

at least one detector each of which being arranged to detect an emission beam emitted by one of the samples to be measured and to produce a detection signal responsive to the detected emission beam, and

a processing device for producing the measurement result for each sample to be measured on the basis of the detection signal related to that sample,

the method comprising;

measuring (401), with a temperature sensor, sample well specific temperatures from the sample wells, and

correcting (402) the measurement result related to each sample to be measured on the basis of the sample well specific temperature measured from the particular sample well containing that sample,

wherein the method further comprises;

moving the plurality of the sample wells with respect to the temperature sensor so as to enable the temperature sensor to measure the sample well specific temperatures from more than one sample well, and

measuring the sample well specific temperature from each particular sample well when that particular sample well is in such a mechanical position that the detector is able to detect the emission beam emitted by the sample stored in that particular sample well.

8. The method according to claim 7, wherein the sample well specific temperature is measured during a time interval when the detector is detecting the emission beam from the sample stored in the corresponding sample well.

9. The method according to claim 7, wherein the measurement result related to each sample to be measured is corrected according to the following rule:

M_corr=M×

F(T),

wherein M_corr is the corrected measurement result, M is the measurement result, and F(T) is a pre-determined function of the sample well specific temperature T measured from the particular sample well containing the sample under consideration.

10. The method according to claim 7, wherein the measurement result related to each sample to be measured is corrected according to the following rule:

M_corr=M×

α

^(T0-T),

wherein M_corr is the corrected measurement result, M is the measurement result, α and

T₀ are predetermined constants, and T is the sample well specific temperature measured from the particular sample well containing the sample under consideration.