Phosphor based authentication system

• US 8,822,954 B2
• Filed: 10/22/2009
• Issued: 09/02/2014
• Est. Priority Date: 10/23/2008
• Status: Expired due to Fees

• Current Assignee: Intematix Corporation
• Original Assignee: Intematix Corporation
• Inventors: Li, Yi-Qun, Yang, Haitao
• Primary Examiner(s): Porta, David
• Assistant Examiner(s): LEE, SHUN K
• Application Number:
  US12/604,268
• Publication Number:
  US 20100102250A1
• Time in Patent Office: 1,776 Days
• Field of Search: 250/459.1
• US Class Current: 250/459.1
• CPC Class Codes: B32B 2255/00 Coating on the layer surface
• CPC Class Codes: B32B 2307/422 Luminescent, fluorescent, phosphorescent
• CPC Class Codes: B32B 2425/00 Cards, e.g. identity cards, credit cards
• CPC Class Codes: B32B 2519/00 Labels, badges
• CPC Class Codes: B32B 2554/00 Paper of special types, e.g. banknotes
• CPC Class Codes: B32B 27/18 characterised by the use of special additives
• CPC Class Codes: B32B 27/283 comprising polysiloxanes
• CPC Class Codes: B32B 27/308 comprising acrylic (co)polymers
• CPC Class Codes: B32B 27/365 comprising polycarbonates
• CPC Class Codes: B32B 29/00 Layered products comprising a layer of paper or cardboard
• CPC Class Codes: B32B 5/24 one layer being a fibrous or filamentary layer
• CPC Class Codes: B42D 25/36 comprising special materials
• CPC Class Codes: B42D 25/387 absorbing or reflecting ultraviolet light
• CPC Class Codes: C09K 11/0883 Arsenides; Nitrides; Phosphides
• CPC Class Codes: C09K 11/7734 Aluminates
• CPC Class Codes: C09K 11/77342 Silicates
• CPC Class Codes: C09K 11/77347 Silicon Nitrides or Silicon Oxynitrides
• CPC Class Codes: C09K 11/77348 Silicon Aluminium Nitrides or Silicon Aluminium Oxynitrides
• CPC Class Codes: C09K 11/7787 Oxides C09K11/7785 takes precedence
• CPC Class Codes: C09K 11/77924 Aluminosilicates
• CPC Class Codes: G01N 2021/6419 : Excitation at two or more wavelengths
• CPC Class Codes: G01N 2021/6421 : Measuring at two or more wavelengths
• CPC Class Codes: G01N 21/64 : Fluorescence; Phosphorescence
• CPC Class Codes: G07D 7/12 : Visible light, infrared or ultraviolet radiation
• CPC Class Codes: G07D 7/1205 : Testing spectral properties
• CPC Class Codes: Y10T 428/24802 : Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
• CPC Class Codes: Y10T 428/31678 : Of metal

Abstract

A phosphor (photo-luminescent) material based authentication system in which a blend (mixture) of at least two, preferably three or more, phosphor materials are used as a photo-luminescent security marking which is applied to or incorporated within an article/document to be authenticated. Preferably, the phosphor materials are each excitable by “eye safe” excitation radiation comprising visible light of wavelength 380 nm to 780 nm. Moreover, when excited the security marking preferably also emits visible light thereby minimizing any risk of damage to an operator'"'"'s eye in the event of accidental exposure to the excitation radiation and/or light generated by the photo-luminescent marking. The authenticity of the article/document can be authenticated by verification of the composition of the phosphor by exciting the marking and comparing one or more selected parameters of light emitted by the security marking with corresponding parameters of the characteristic emission spectrum of the authentic phosphor blend.

Claims

1. A method of authenticating a photo-luminescent security marking in which an authentic security marking comprises a blend of at least two phosphor materials, the method comprising:

a) irradiating the marking with a first excitation radiation of only a first wavelength within a first wavelength range, wherein the first radiation having only the first wavelength excites both a first phosphor and a second phosphor, and measuring at least one selected parameter of light emitted by the first phosphor and the second phosphor within the marking,

b) irradiating the marking with a second excitation radiation of only a second wavelength that is within a second wavelength range, wherein the second radiation having only the second wavelength excites only the second phosphor, and measuring the at least one selected parameter of light emitted by the second phosphor within the marking,

c) irradiating the marking with a third excitation radiation that includes both the first and second wavelengths, wherein the third radiation having the first and second wavelengths excites both the first phosphor and the second phosphor, and measuring the at least one selected parameter of light emitted by the first phosphor and the second phosphor within the marking, and

d) comparing the selected parameters measured in a), b) and c) with corresponding parameters of the known emission characteristic and if the parameters are within prescribed limits verifying the authenticity of the marking.

2. The method according to claim 1, wherein the at least one selected parameter comprises intensity of selected wavelength region.

3. The method according to claim 1, wherein the at least one selected parameter comprises ratio of intensities of selected wavelength regions.

4. The method according to claim 1, wherein the at least one selected parameter comprises intensity of an emission peak.

5. The method according to claim 1, wherein the at least one selected parameter comprises wavelength of an emission peak.

6. The method according to claim 1, wherein the at least one selected parameter comprises rate of rise of an emission peak.

7. The method according to claim 1, wherein the at least one selected parameter comprises rate of fall of an emission peak.

8. The method according to claim 1, wherein the at least one selected parameter comprises ratio of emission peak intensities.

9. The method according to claim 1, wherein the at least one selected parameter comprises ratio of emission peak wavelengths.

10. The method according to claim 1, wherein the at least one selected parameter comprises intensity of an emission trough.

11. The method according to claim 1, wherein the at least one selected parameter comprises wavelength of an emission trough.

12. The method according to claim 1, wherein the at least one selected parameter comprises ratio of emission trough intensities.

13. The method according to claim 1, wherein the at least one selected parameter comprises ratio of emission trough wavelengths.

14. The method according to claim 1, wherein the at least one selected parameter comprises wavelength of a point of inflection.

15. The method according to claim 1, wherein the at least one selected parameter comprises intensity of a point of inflection.

16. The method according to claim 1, wherein the at least one selected parameter comprises ratio of point of inflection intensities.

17. The method according to claim 1, wherein the at least one selected parameter comprises ratio of points of inflection wavelengths.

18. The method according to claim 1, wherein the at least one selected parameter comprises number of emission peaks.

19. The method according to claim 1, wherein the at least one selected parameter comprises number of emission troughs.

20. The method according to claim 1, wherein the at least one selected parameter comprises number of points of inflection.

21. The method according to claim 1, wherein the at least one selected parameter comprises shape of emission peak.

22. The method according to claim 1, wherein irradiating the marking with the third excitation radiation causes the at least one selected parameter of light that is measured to include a combination of emissions by the second phosphor corresponding to both the first wavelength and the second wavelength.