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Time-based apparatus and method to mitigate semiconductor aging effects

  • US 8,823,447 B2
  • Filed: 12/20/2011
  • Issued: 09/02/2014
  • Est. Priority Date: 08/17/2011
  • Status: Expired due to Fees
First Claim
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1. A method of mitigating an effect of aging semiconductor material in an electronic device, comprising:

  • initializing a first operating voltage for the electronic device to a predetermined initial voltage level;

    determining an elapsed time since an initial time by determining a difference between the initial time and a current time provided by a time clock;

    determining a first appropriate operating voltage based on the determined elapsed time; and

    setting the first operating voltage to the first appropriate operating voltage.

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