Course of motion determination

• US 8,825,438 B2
• Filed: 08/19/2008
• Issued: 09/02/2014
• Est. Priority Date: 08/20/2007
• Status: Active Grant

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: Anderson, Stephen James, Smith, Andrew Edward, Cordwell, James Stephen Edward
• Primary Examiner(s): BHAT, ADITYA S
• Application Number:
  US12/673,114
• Publication Number:
  US 20110264402A1
• Time in Patent Office: 2,205 Days
• Field of Search: None
• US Class Current: 702/150
• CPC Class Codes: G01B 21/04 by measuring coordinates of points
• CPC Class Codes: G01C 9/00 Measuring inclination, e.g. by clinometers, by levels
• CPC Class Codes: G05B 19/4015 going to a reference at the beginning of machine cycle, e.g. for calibration
• CPC Class Codes: G05B 2219/37196 Measuring station, flexible, integrated cmm
• CPC Class Codes: G05B 2219/37451 Plan sensor placement for optimal inspection

Abstract

A computer-implemented method for determining a course of motion between an artifact (10) and device (28) for interacting with the artifact (10) that are moveable relative to each other in at least one linear (X, Y, Z) and one rotational (A1, A2) degree of freedom, the method comprising: receiving geometric data representing the artifact (10); receiving geometric data representing the device; and determining, from the geometric data, how the device (28) and artifact (10) can be oriented relative to each other along an interaction path so as to comply with one or more optimization criteria.

Claims

1. A computer-implemented method for determining a course of motion between an artefact and a measurement device for interacting with the artefact, the artefact and the measurement device being moveable relative to each other in at least one linear and one rotational degree of freedom, the method comprising:

receiving, by a processing unit and before the measurement device and the artefact relatively move in a position sensing relationship so as to obtain measurement data about the artefact, first geometric data representing the artefact;

receiving, by the processing unit, second geometric data representing the measurement device; and

automatically determining, by the processing unit, the course of motion between the artefact and the measurement device based upon the received first and second geometric data, the determining of the course of motion including;

determining, from the received first and second geometric data, instructions for automatically manipulating a relative angular orientation between the measurement device and the artefact about the at least one rotational degree of freedom as the measurement device and the artefact relatively move in the position sensing relationship so as to obtain the measurement data about the artefact along a measurement path, wherein the instructions for automatically manipulating the relative angular orientation comply with one or more optimisation criteria.

2. The method as claimed in claim 1, wherein the one or more optimisation criteria comprises collision free movement.

3. The method as claimed in claim 1, further comprising determining how the relative angular orientation between the measurement device and artefact can be controlled in order to meet one or more performance criteria.

4. The method as claimed in claim 3, wherein the one or more performance criteria comprises at least one of i) device acceleration, ii) speed of interaction, iii) path length and iv) direction of motion of the device.

5. The method as claimed in claim 3, wherein the one or more performance criteria comprises a preferred relative angular orientation between the measurement device and artefact.

6. The method as claimed in claim 1, further comprising determining for each of a plurality of points along the measurement path a plurality of relative angular orientations between the device and artefact.

7. The method as claimed in claim 6, further comprising selecting only collision free angular orientations.

8. The method as claimed in claim 6, further comprising determining the cost of movement between a pair of points with a first angular orientation combination and the cost of movement between the same pair of points with a second angular orientation combination.

9. The method as claimed in claim 8, further comprising repeating the step of claim 8 for a plurality of pairs of points along the measurement path.

10. The method as claimed in claim 9, further comprising selecting those angular orientations in which the total cost along the measurement path complies with predetermined criteria.

11. The method as claimed in claim 1, wherein the device is a contact probe.

12. The method as claimed in claim 1, wherein the device is a non-contact probe.

13. The method as claimed in claim 1, wherein the device is moveable in at least three orthogonal linear degrees of freedom and at least two orthogonal rotational degrees of freedom.

14. The method as claimed in claim 1, further comprising receiving geometric data relating to objects located in the device'"'"'s movement volume.

15. The method as claimed in claim 1, further comprising generating the measurement path using the first and second geometric data.

16. The method as claimed in claim 1, further comprising controlling a positioning machine to move a measurement device mounted thereon in accordance with the course of motion data so as to interact with an artefact.

17. The method as claimed in claim 16, wherein the positioning machine is a coordinate measuring machine.

18. The method as claimed in claim 16, wherein the positioning machine is a machine tool.

19. A non-transitory computer readable storage medium storing instructions which, when executed by a computer, causes the computer to perform the method of claim 1.

20. A computer comprising:

a processor; and

a memory, wherein

at least one of the processor and memory is adapted to perform the method of claim 1.