Optimizing vision correction procedures

• US 8,827,452 B2
• Filed: 05/24/2013
• Issued: 09/09/2014
• Est. Priority Date: 01/20/2006
• Status: Expired due to Fees

• Current Assignee: Clarity Medical Systems, Inc.
• Original Assignee: Clarity Medical Systems, Inc.
• Inventors: Zhou, Yan, Shea, William
• Primary Examiner(s): HASAN, MOHAMMED A
• Application Number:
  US13/902,716
• Publication Number:
  US 20130265541A1
• Time in Patent Office: 473 Days
• Field of Search: 351200-246
• US Class Current: 351/205
• CPC Class Codes: A61B 3/0025 characterised by electronic signal processing, e.g. eye models
• CPC Class Codes: A61B 3/0041 characterised by display arrangements
• CPC Class Codes: A61B 3/0091 Fixation targets for viewing direction
• CPC Class Codes: A61B 3/036 for testing astigmatism
• CPC Class Codes: A61B 3/10 Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
• CPC Class Codes: A61B 3/1015 for wavefront analysis
• CPC Class Codes: A61B 3/103 for determining refraction, e.g. refractometers, skiascopes
• CPC Class Codes: A61B 3/1035 for measuring astigmatism testing astigmatism A61B3/036
• CPC Class Codes: A61B 3/13 Ophthalmic microscopes
• CPC Class Codes: A61B 3/14 Arrangements specially adapted for eye photography apparatus or arrangements for taking photographs per se G03B
• CPC Class Codes: A61B 5/7415 Sound rendering of measured values, e.g. by pitch or volume variation A61B5/741 takes precedence
• CPC Class Codes: A61B 90/20 Surgical microscopes characterised by non-optical aspects
• CPC Class Codes: G01J 2003/064 Use of other elements for scan, e.g. mirror, fixed grating
• CPC Class Codes: G01J 9/00 Measuring optical phase difference devices or arrangements for controlling the phase of light beams G02F1/01; Determining degree of coherence; Measuring optical wavelength spectrometry G01J3/00

Abstract

In one embodiment, a wavefront sensor is combined with a slit lamp eye examination device so that real time aberration values of an eye being examined can be viewed during a slit lamp eye examination session.

Claims

1. An apparatus comprising:

a wavefront sensor configured to measure real time aberration values of a wavefront returned from an eye of a patient during a slit lamp eye examination session when the eye of a patient is examined using a slit lamp eye examination device and with the wavefront sensor combined with the slit lamp eye examination device and configured to provide an output signal indicating the real time aberration values; and

a display, coupled to the wavefront sensor, configured to show a dynamic display indicating the real time aberration values output by the wavefront sensor and with the display configured to be viewed while also viewing the eye of the patient during the examination.

2. The apparatus of claim 1 with the wavefront sensor further comprising:

an offsetting mechanism configured to be controlled by the surgeon during the vision correction procedure to offset selected wavefront aberration components in order to highlight or amplify clinically important features of other non-offset aberration components of the wavefront returned from the eye of the patient.

3. The apparatus of claim 1 further comprising:

a detection mechanism that outputs aberration values resulting from the tilt of different sub-portions of the wavefront where the dynamic display is formed by displaying the aberration values.

4. The apparatus of claim 3 where the detection mechanism comprises:

a single position sensing device that measures the tilt of different sub-portions of the wavefront that are sequentially directed onto the single position sensing device.

5. The apparatus of claim 4 further comprising:

a beam scanning mechanism for directing different sub-portions of the wavefront onto the single position sensing device.

6. The apparatus of claim 5 where the beam scanning mechanism directs sub-portions included in an annular ring portion of the wavefront onto the single position sensing device.