FinFET device and method of manufacturing same
First Claim
1. A method of forming a semiconductor device comprising:
- forming a plurality of fins over a substrate;
forming an insulation material in a region between the plurality of fins;
forming a dielectric layer over the plurality of fins and over the insulation material in the region between the plurality of fins;
forming a work function metal over the plurality of fins and over the dielectric layer in the region between the plurality of fins;
forming a strained material over the work function metal in the region between the plurality of fins; and
forming a signal metal over the plurality of fins, over the work function metal, and over the strained material.
1 Assignment
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Accused Products
Abstract
A semiconductor device and method for fabricating a semiconductor device is disclosed. An exemplary semiconductor device includes a substrate including a fin structure including one or more fins disposed on the substrate. The semiconductor device further includes a dielectric layer disposed on a central portion of the fin structure and traversing each of the one or more fins. The semiconductor device further includes a work function metal disposed on the dielectric layer and traversing each of the one or more fins. The semiconductor device further includes a strained material disposed on the work function metal and interposed between each of the one or more fins. The semiconductor device further includes a signal metal disposed on the work function metal and on the strained material and traversing each of the one or more fins.
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Citations
20 Claims
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1. A method of forming a semiconductor device comprising:
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forming a plurality of fins over a substrate; forming an insulation material in a region between the plurality of fins; forming a dielectric layer over the plurality of fins and over the insulation material in the region between the plurality of fins; forming a work function metal over the plurality of fins and over the dielectric layer in the region between the plurality of fins; forming a strained material over the work function metal in the region between the plurality of fins; and forming a signal metal over the plurality of fins, over the work function metal, and over the strained material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of forming a semiconductor device comprising:
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forming first and second fins over a substrate; depositing a dielectric layer over a central portion of the first and second fins; depositing a work function metal over the dielectric layer and over the first and second fins; depositing a strained material over the work function metal and interposed between the first and second fins; and depositing a signal metal over the work function metal and over the strained material, the signal metal traversing the first and second fins. - View Dependent Claims (10, 11, 12, 13)
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14. A method of manufacturing a semiconductor device, comprising:
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providing a substrate; forming a fin structure including one or more fins over the substrate, each of the one or more fins including first and second sidewalls; depositing an insulation material on the substrate and the fin structure, the insulation material substantially filling a region between each of the one or more fins; removing a portion of the insulation material from the region between each of the one or more fins such that a portion of the first and second sidewalls of each of the one or more fins is exposed; forming a dielectric layer over a central portion of each of the one or more fins; forming a work function metal over the dielectric layer and disposed in the region between each of the one or more fins; forming a strained material on the work function metal, the strained material being disposed in the region between each of the one or more fins; and etching back the strained material in the region between each of the one or more fins. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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Specification