Approach to integrate Schottky in MOSFET
First Claim
1. A method for forming an integrated structure combining one or more field effect transistors and a Schottky diode, the method comprising:
- a) forming a plurality of trenches formed into a semiconductor substrate and extending into the substrate thereby forming a plurality of mesas there between, each trench being substantially filled with a conductive material that is separated from the trench walls by a thin layer of dielectric material to form a gate region of one or more field effect transistors;
b) forming at least two contact trenches in each mesa, each contact trench extending along a portion of depth of a doped body region of a first conductivity type opposite that of the substrate formed inside each mesa, whereby at least two contact trenches are separated by an exposed portion of the substrate, wherein each contact trench has an end that abuts the exposed portion of the substrate composition;
c) forming a pair of doped source regions of a second conductivity type formed adjacent to and on opposite sides of each contact trench inside the doped body region; and
d) forming a Schottky diode comprising Schottky barrier metal formed over the exposed portion of the substrate, the Schottky barrier metal forming a Schottky junction at an interface between the Schottky barrier metal and an exposed surface of the exposed portion of the substrate separating the two contact trenches.
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Accused Products
Abstract
An integrated structure combines field effect transistors and a Schottky diode. Trenches formed into a substrate composition extend along a depth of the substrate composition forming mesas therebetween. Each trench is filled with conductive material separated from the trench walls by dielectric material forming a gate region. Two first conductivity type body regions inside each mesa form wells partly into the depth of the substrate composition. An exposed portion of the substrate composition separates the body regions. Second conductivity type source regions inside each body region are adjacent to and on opposite sides of each well. Schottky barrier metal inside each well forms Schottky junctions at interfaces with exposed vertical sidewalls of the exposed portion of the substrate composition separating the body regions.
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Citations
20 Claims
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1. A method for forming an integrated structure combining one or more field effect transistors and a Schottky diode, the method comprising:
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a) forming a plurality of trenches formed into a semiconductor substrate and extending into the substrate thereby forming a plurality of mesas there between, each trench being substantially filled with a conductive material that is separated from the trench walls by a thin layer of dielectric material to form a gate region of one or more field effect transistors; b) forming at least two contact trenches in each mesa, each contact trench extending along a portion of depth of a doped body region of a first conductivity type opposite that of the substrate formed inside each mesa, whereby at least two contact trenches are separated by an exposed portion of the substrate, wherein each contact trench has an end that abuts the exposed portion of the substrate composition; c) forming a pair of doped source regions of a second conductivity type formed adjacent to and on opposite sides of each contact trench inside the doped body region; and d) forming a Schottky diode comprising Schottky barrier metal formed over the exposed portion of the substrate, the Schottky barrier metal forming a Schottky junction at an interface between the Schottky barrier metal and an exposed surface of the exposed portion of the substrate separating the two contact trenches. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A device, comprising:
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a) a plurality of trenches formed into a semiconductor substrate and extending into the substrate forming a plurality of mesas there between, each trench being substantially filled with a conductive material that is separated from the trench walls by a thin layer of dielectric material to form a gate region of one or more field effect transistors; b) at least two contact trenches formed in each mesa, each contact trench extending along a portion of depth of a doped body region of a first conductivity type opposite that of the substrate formed inside each mesa, whereby at least two contact trenches are separated by an exposed portion of the substrate, wherein each contact trench has an end that abuts the exposed portion of the substrate composition; c) a pair of doped source regions of a second conductivity type formed adjacent to and on opposite sides of each contact trench inside the doped body region; and d) a Schottky diode comprising Schottky barrier metal formed over the exposed portion of the substrate, the Schottky barrier metal forming a Schottky junction at an interface between the Schottky barrier metal and an exposed surface of the exposed portion of the substrate separating the two contact trenches. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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Specification