Method and apparatus for interrogating electronic equipment components
First Claim
1. An apparatus for interrogating an electronic circuit supported by a substrate, comprising:
- a tester positioned external and spaced from the substrate and comprising a tester transceiver;
a testing circuit supported by the substrate and connected to the electronic circuit, the testing circuit comprising a processor and a testing circuit transceiver;
the testing circuit transceiver communicating with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation of the electronic circuit from the processor to the tester;
the processor and the testing circuit transceiver being separate and distinct from the electronic circuit to be interrogated; and
the processor being programmed to process instructions from the tester to interrogate the electronic circuit with the interrogation corresponding to the instructions.
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Accused Products
Abstract
An apparatus for interrogating an electronic circuit supported by a substrate includes a tester external to the substrate and comprising an tester transceiver. A testing circuit is supported by the substrate and connected to the electronic circuit. The testing circuit includes a processor and a testing circuit transceiver in communication with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation from the processor to the tester. The processor being programmed to process instructions from the tester to interrogate the electronic circuit with an interrogation corresponding to the instructions.
181 Citations
12 Claims
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1. An apparatus for interrogating an electronic circuit supported by a substrate, comprising:
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a tester positioned external and spaced from the substrate and comprising a tester transceiver; a testing circuit supported by the substrate and connected to the electronic circuit, the testing circuit comprising a processor and a testing circuit transceiver; the testing circuit transceiver communicating with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation of the electronic circuit from the processor to the tester; the processor and the testing circuit transceiver being separate and distinct from the electronic circuit to be interrogated; and the processor being programmed to process instructions from the tester to interrogate the electronic circuit with the interrogation corresponding to the instructions. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An apparatus for interrogating an electronic circuit supported by a substrate comporising;
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a tester positioned external and spaced from the substrate and comprising a tester transceiver; a testing circuit supported by the substrate and connected to the electronic circuit, the testing, circuit comprising a processor and a testing circuit transceiver in communication with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation from the processor to the tester; and the processor being programmed to process instructions from the tester to interrogate the electronic circuit with an interrogation corresponding to the instructions; and wherein the processor comprises a reference circuit element for referencing results of the interrogation.
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Specification