Schematic display of protocol-specific information

• US 8,837,294 B2
• Filed: 04/25/2007
• Issued: 09/16/2014
• Est. Priority Date: 12/19/2006
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Frishberg, Leo, Bear, Eric Gould
• Primary Examiner(s): Hamza, Faruk
• Assistant Examiner(s): GUADALUPE CRUZ, AIXA AMYR
• Application Number:
  US11/740,135
• Publication Number:
  US 20080144656A1
• Time in Patent Office: 2,701 Days
• Field of Search: None
• US Class Current: 370/241
• CPC Class Codes: H04L 41/22 comprising specially adapted graphical user interfaces [GUI]
• CPC Class Codes: H04L 43/045 for graphical visualisation of monitoring data
• CPC Class Codes: H04L 43/18 Protocol analysers
• CPC Class Codes: H04L 43/50 Testing arrangements
• CPC Class Codes: H04L 67/75 Indicating network or usage conditions on the user display

Abstract

A test and measurement instrument for displaying data including an acquisition system configured to receive an input signal, a processor coupled to the acquisition system and configured to generate a schematic from protocol-specific information within the input signal, and a display coupled to the processor and configured to display the schematic.

Claims

1. A method for use in a protocol analyzer, of displaying data, the data rep resenting a schematic of a system under test, said system using communications among components of said system, comprising the steps of:

acquiring the data from the system;

extracting protocol-specific information from the data;

analyzing said extracted protocol-specific information to detect errors;

converting the protocol-specific information into schematic elements, the schematic elements being selected from the group consisting of devices, functions, operations, connections, and links;

generating from the schematic elements a symbolic representation of the system in the form of said schematic;

annotating said symbolic representations to indicate an occurrence of one of said errors; and

displaying the schematic on a display screen of the protocol analyzer.

2. The method of claim 1, further comprising:

receiving a correlation among schematic elements; and

adjusting the schematic in response to the correlation.

3. The method of claim 1, further comprising:

selecting one of the schematic elements in the schematic; and

adjusting others of the schematic elements associated with the selected one of the schematic elements.

4. The method of claim 3, wherein selecting one of the schematic elements includes at least one of:

selecting the schematic element in response to a user input; and

selecting the schematic element in response to an automated process.

5. The method of claim 1, further comprising:

selecting one of the schematic elements in the schematic; and

adjusting an additional display of the data in response to the selected one of the schematic elements.

6. The method of claim 1, further comprising:

selecting an element of an additional display of the data; and

adjusting the schematic elements in response to the selection.

7. The method of claim 1, further comprising:

displaying development of the schematic over time in response to the protocol-specific information.

8. The method of claim 7, further comprising adjusting the development of the schematic in response to at least one of a user input and an automated process.

9. The method of claim 7, further comprising:

extracting additional protocol-specific information from the data;

updating the schematic elements with the additional protocol-specific information;

updating the schematic with the updated schematic elements; and

displaying the updated schematic.

10. The method of claim 1, further comprising:

adjusting one of the schematic elements in response to the protocol-specific information associated with the one schematic element.

11. The method of claim 10, further comprising:

adjusting the one schematic element to indicate an accuracy of the one schematic element.

12. The method of claim 1, further comprising:

annotating one or more of the schematic elements in response to the protocol-specific information;

wherein annotating the schematic elements includes annotating the schematic elements to indicate process flow.

13. The method of claim 1, further comprising:

initializing the schematic with a previously assembled schematic; and

updating the schematic with the schematic elements.

14. The method of claim 1, further comprising:

selecting one of the schematic elements in the schematic; and

highlighting other schematic elements associated with the selected schematic element.

15. The method of claim 1, further comprising:

selecting one of the schematic elements in the schematic; and

reassembling the schematic elements into the schematic such that schematic elements associated with the selected schematic element are illustrated at a different level of information detail.

16. The method of claim 1, further comprising:

selecting one of the schematic elements in the schematic; and

displaying data associated with the selected schematic element.

17. The method of claim 16, further comprising:

removing data not associated with the selected schematic element.

18. The method of claim 1, further comprising:

selecting one of the schematic elements in the schematic; and

generating a trigger parameter in response to the selected schematic element.

19. The method of claim 1, wherein displaying the schematic includes at least one of:

visually presenting the schematic;

aurally presenting the schematic; and

tactilely presenting the schematic.

20. A test and measurement instrument for displaying data, the data representing a system of the type using communications among components of the system, comprising:

an acquisition system configured to receive an input signal to convert it into the data;

a processor coupled to the acquisition system and configured to extract protocol-specific information from the data, to convert the protocol-specific information into schematic elements, the schematic elements being selected from the group consisting of devices, functions, operations connections, and links, and to generate a symbolic representation in the form of a schematic for the system from the schematic elements;

said processor analyzing said extracted protocol-specific information to detect errors;

said processor annotating said symbolic representations to indicate an occurrence of one of said errors; and

a display coupled to the processor and configure to display the schematic.

21. The test and measurement instrument of claim 20, further comprising:

a schematic element manipulation interface configured to receive a selected one of the schematic elements as an input;

wherein the processor is further configured to adjust schematic elements associated with the selected schematic element in the schematic.

22. The test and measurement instrument of claim 20, further comprising:

a virtual probe interface configured to receive a selected schematic element input corresponding to a selected one of the schematic elements;

wherein the processor is further configured to display protocol-specific information associated with the selected schematic element.

23. The test and measurement instrument of claim 20, further comprising:

a correlation interface configured to receive a correlation input identifying a first schematic element and a second schematic element of the schematic;

wherein the processor is further configured to adjust the schematic such that the first and second schematic elements are correlated in the schematic.

24. The test and measurement instrument of claim 20, further comprising:

a schematic animation interface configured to control an animation position;

wherein the processor is further configured to adjust the schematic in response to a change in the animation position.

25. The test and measurement instrument of claim 20, further comprising:

a semantic zoom interface configured to control a semantic zoom level;

wherein the processor is further configured to adjust a level of information detail in the schematic in response to the semantic zoom interface.

26. A test and measurement instrument for displaying data, the data rep resenting a system of the type using communications among components of the system, comprising:

means for receiving the data;

means for extracting protocol-specific information from the data;

means for converting the protocol-specific information into schematic elements, the schematic elements being selected from the group consisting of devices, functions, operations, connections, and links;

means for assembling the schematic element into a schematic for the system; and

means for displaying the schematic.

27. The test and measurement instrument of claim 26, further comprising:

means for selecting one of the schematic elements in the schematic; and

means for adjusting the schematic elements associated with the selected schematic element.

28. The test and measurement instrument of claim 26, further comprising:

means for displaying development of the schematic.

29. The test and measurement instrument of claim 26, further comprising:

means for adjusting one of the schematic elements in response to protocol-specific information associated with the one schematic element.