Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
First Claim
1. A re-configurable test circuit for use in an automated test equipment, the test circuit comprising:
- a test processor;
a programmable logic device; and
a pin electronics circuit configured to provide an interface between the re-configurable test circuit and a device-under-test;
wherein the test processor comprises a timing circuit configured to provide one or more adjustable-timing signals comprising an adjustable timing;
wherein the programmable logic device is configured to implement a state machine, a state sequence of which is dependent on one or more input signals received via the pin electronics circuit;
wherein the re-configurable test circuit is configured to acquire, using the programmable logic device, an output signal, which output signal is dependent on a current or previous state of the state machine, and which output signal is indicative of a signal to be output by the pin electronics circuit, in response to the one or more input signals received from the pin electronics circuit; and
wherein the test processor is coupled to the programmable logic device and wherein the test processor is configured to adjust, using the one or more adjustable-timing signals, a timing used in a signal processing path, wherein the signal processing path comprises a path through the programmable logic device to provide the output signal in dependence on the one or more input signals.
5 Assignments
0 Petitions
Accused Products
Abstract
A re-configurable test circuit for use in an automated test equipment includes a test circuit, a test processor and a programmable logic device. The pin electronics circuit is configured to interface the re-configurable test circuit with a DUT. The test processor includes a timing circuit configured to provide one or more adjustable-timing signals having adjustable timing. The programmable logic device is configured to implement a state machine, a state sequence of which depends on one or more input signals received from the pin electronics circuit, to provide an output signal, which depends on a current or previous state of the state machine, to the pin electronics circuit in response to the signal(s) received from the pin electronics circuit. The test processor is coupled to the programmable logic device to provide at least one of the adjustable-timing signal(s) to the programmable logic device to define timing of the programmable logic device.
-
Citations
49 Claims
-
1. A re-configurable test circuit for use in an automated test equipment, the test circuit comprising:
-
a test processor;
a programmable logic device; anda pin electronics circuit configured to provide an interface between the re-configurable test circuit and a device-under-test; wherein the test processor comprises a timing circuit configured to provide one or more adjustable-timing signals comprising an adjustable timing; wherein the programmable logic device is configured to implement a state machine, a state sequence of which is dependent on one or more input signals received via the pin electronics circuit; wherein the re-configurable test circuit is configured to acquire, using the programmable logic device, an output signal, which output signal is dependent on a current or previous state of the state machine, and which output signal is indicative of a signal to be output by the pin electronics circuit, in response to the one or more input signals received from the pin electronics circuit; and wherein the test processor is coupled to the programmable logic device and wherein the test processor is configured to adjust, using the one or more adjustable-timing signals, a timing used in a signal processing path, wherein the signal processing path comprises a path through the programmable logic device to provide the output signal in dependence on the one or more input signals. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42)
-
-
43. A method for operating an automated test equipment, the method comprising:
-
providing one or more adjustable-timing signals using a test processor; implementing, using a programmable logic device, a state machine, a state sequence of which is dependent on one or more signals received via a pin electronics circuit, to acquire, using the programmable logic device, an output signal, which output signal is dependent on a current or previous state of the state machine, in response to the one or more signals received via the pin electronics circuit; wherein a timing used in a signal processing, which signal processing is used to acquire the output signal, is adjusted in response to at least one of the one or more adjustable-timing signals. - View Dependent Claims (44)
-
-
45. An apparatus for setting up an automated test equipment, the automated test equipment comprising a configurable test processor, a programmable logic device and a pin electronics circuit, the apparatus being adapted to:
-
configure the test processor to provide one or more adjustable-timing signals comprising an adjustable timing; configure the programmable logic device to implement a state machine, a state sequence of which state machine is dependent on one or more input signals received via the pin electronics circuit, to acquire, using the programmable logic device, an output signal to be output via the pin electronics circuit in response to the one or more signals received via the pin electronics circuit, wherein the output signal is dependent on a current or previous state of the state machine; and configure the automated test equipment, such that a timing used in a signal processing, which signal processing is used to acquire the output signal, is adjusted in response to at least one of the one or more adjustable-timing signals.
-
-
46. A method for setting up an automated test equipment, the automated test equipment comprising a configurable test processor, a programmable logic device and a pin electronics circuit, the method comprising:
-
configuring the programmable test processor to provide one or more adjustable-timing signals comprising an adjustable timing; and configuring the programmable logic device to implement a state machine, a state sequence of which state machine is dependent on one or more input signals received via a pin electronics circuit to acquire, using the programmable logic device, an output signal to be output via the pin electronics circuit in response to the one or more signals received via the pin electronics circuit, wherein the output signal is dependent on a current or previous state of the state machine; and wherein at least one of the adjustable-timing signals determines a timing used in a signal processing, which signal processing is used to generate the output signal.
-
-
47. A computer program for performing the method for operating an automated test equipment, the method comprising:
-
providing one or more adjustable-timing signals using a test processor; implementing, using a programmable logic device, a state machine, a state sequence of which is dependent on one or more signals received via a pin electronics circuit, to acquire, using the programmable logic device, an output signal, which output signal is dependent on a current or previous state of the state machine, in response to the one or more signals received via the pin electronics circuit; wherein a timing used in a signal processing, which signal processing is used to acquire the output signal, is adjusted in response to at least one of the one or more adjustable-timing signals, when the computer program runs on a computer. - View Dependent Claims (48)
when the computer program runs on a computer.
-
-
49. A computer program for performing the method for setting up an automated test equipment, the automated test equipment comprising a configurable test processor, a programmable logic device and a pin electronics circuit, the method comprising:
-
configuring the programmable test processor to provide one or more adjustable-timing signals comprising an adjustable timing; and configuring the programmable logic device to implement a state machine, a state sequence of which state machine is dependent on one or more input signals received via a pin electronics circuit to acquire, using the programmable logic device, an output signal to be output via the pin electronics circuit in response to the one or more signals received via the pin electronics circuit, wherein the output signal is dependent on a current or previous state of the state machine; and wherein at least one of the adjustable-timing signals determines a timing used in a signal processing, which signal processing is used to generate the output signal, when the computer program runs on a computer.
-
Specification