Method and system for semiconductor process control and monitoring by using a data quality metric
First Claim
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1. A method of monitoring a production process for processing microstructure devices in at least one process tool, the method comprising:
- performing a data communication process so as to communicate a plurality of measurement data at least several times from said at least one process tool to a fault detection system during processing of a microstructure device;
determining a data communication quality metric in said fault detection system, said data communication quality metric comprising a momentary data rate between successive measurements generated for each of the plurality of measurement data and indicating at least a degree of completeness of said measurement data; and
performing a fault detection process in said fault detection system using said plurality of measurement data and said data communication quality metric as inputs to the fault detection process.
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Abstract
During fault detection of a production process, the influence of the data communication process for communicating measurement readings to the fault detection system may be taken into consideration. In one illustrative embodiment, a data rate related parameter may be used as an input variable for a data reduction procedure, thereby enabling an efficient assessment of the quality of the remaining “real” process and tool parameters.
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Citations
20 Claims
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1. A method of monitoring a production process for processing microstructure devices in at least one process tool, the method comprising:
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performing a data communication process so as to communicate a plurality of measurement data at least several times from said at least one process tool to a fault detection system during processing of a microstructure device; determining a data communication quality metric in said fault detection system, said data communication quality metric comprising a momentary data rate between successive measurements generated for each of the plurality of measurement data and indicating at least a degree of completeness of said measurement data; and performing a fault detection process in said fault detection system using said plurality of measurement data and said data communication quality metric as inputs to the fault detection process. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of fault detection in a semiconductor manufacturing process, the method comprising:
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communicating a plurality of measurement data for each of a plurality of process parameters of said manufacturing process to a fault detection system; performing a data reduction process in said fault detection system by using each of said plurality of process parameters as an input variable; determining a momentary data rate metric between successive measurements for each of the measurement data provided by a data communication process used for communicating said measurement data; using said momentary data rate metric as a further input variable of said data reduction process; and assessing said semiconductor manufacturing process by using a quality metric obtained by said data reduction process and generated using said input variables and a data rate contribution value indicating a contribution of said momentary data rate metric to said quality metric. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17)
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18. A fault detection system, comprising:
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an interface configured to receive a plurality of measurement data from at least one process tool used for processing a substrate, said measurement data being indicative of a plurality of process parameters of said at least one process tool; and a fault detection module connected to said interface and configured to determine a data communication quality metric indicating at least a momentary data rate between successive measurements of a data communication of said interface when receiving said measurement data for each of the plurality of measurement data, said fault detection module further being configured to determine a fault condition of said at least one process tool using said data communication quality metric and said measurement data as inputs to said fault detection module. - View Dependent Claims (19, 20)
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Specification