Systems, devices, and methods including a dark-field reflected-illumination apparatus
First Claim
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1. A dark-field detection system, comprising:
- an illumination angle controller that modulates an angle of incidence of electromagnetic energy delivered by a dark-field illuminator, the dark-field illuminator oriented to focus electromagnetic energy onto at least one focal region of a sample, at one or more angles of incidence relative to an optical axis of an optical assembly;
an aperture controller operably coupled to an aperture device, the aperture controller operable to modulate an effective numerical aperture associated with a collection zone of scattered electromagnetic energy from the sample interrogated by the electromagnetic energy delivered by the dark-field illuminator; and
an illumination-collection separation controller operably coupled to the illumination angle controller and the aperture controller, the illumination-collection separation controller configured to vary an illumination-collection spacing, bounded in part by the electromagnetic energy delivered by the dark-field illuminator and the collection zone, by actuating at least one of the illumination angle controller or the aperture controller.
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Abstract
Systems, devices, and methods are described that modulate a specimen-background dark-field micrograph contrast.
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Citations
16 Claims
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1. A dark-field detection system, comprising:
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an illumination angle controller that modulates an angle of incidence of electromagnetic energy delivered by a dark-field illuminator, the dark-field illuminator oriented to focus electromagnetic energy onto at least one focal region of a sample, at one or more angles of incidence relative to an optical axis of an optical assembly; an aperture controller operably coupled to an aperture device, the aperture controller operable to modulate an effective numerical aperture associated with a collection zone of scattered electromagnetic energy from the sample interrogated by the electromagnetic energy delivered by the dark-field illuminator; and an illumination-collection separation controller operably coupled to the illumination angle controller and the aperture controller, the illumination-collection separation controller configured to vary an illumination-collection spacing, bounded in part by the electromagnetic energy delivered by the dark-field illuminator and the collection zone, by actuating at least one of the illumination angle controller or the aperture controller. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An apparatus, comprising:
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a plurality of interrogators each comprising a waveguide assembly including one or more electromagnetic energy waveguides configured to be coupled to at least one electromagnetic energy emitter, the plurality of interrogators oriented to focus electromagnetic energy onto at least one focal region at one or more angles of incidence relative to an optical axis of an optical assembly; a collection aperture device having a controllable effective numerical aperture associated with a sample-scattering collection zone; an illumination-collection separation controller operably coupled to one or more of the plurality of interrogators and to the collection aperture device, the illumination-collection separation controller configured to modulate a separation zone defined by an electromagnetic energy delivered by the dark-field illuminator and the sample-scattering collection zone. - View Dependent Claims (14, 15, 16)
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Specification