Systems and methods for measuring a profile characteristic of a glass sample

• US 8,854,623 B2
• Filed: 10/16/2013
• Issued: 10/07/2014
• Est. Priority Date: 10/25/2012
• Status: Active Grant

• Current Assignee: Corning Incorporated
• Original Assignee: Corning Incorporated
• Inventors: Fontaine, Norman Henry, Schneider, Vitor Marino
• Primary Examiner(s): Chowdhury, Tarifur
• Assistant Examiner(s): Valentin, II, Juan D
• Application Number:
  US14/055,351
• Publication Number:
  US 20140118740A1
• Time in Patent Office: 356 Days
• US Class Current: 356/364
• CPC Class Codes: G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
• CPC Class Codes: G01L 1/241 by photoelastic stress analysis
• CPC Class Codes: G01M 11/30 Testing of optical devices, constituted by fibre optics or optical waveguides
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G01N 21/23 Bi-refringence
• CPC Class Codes: G01N 21/41 Refractivity; Phase-affecting properties, e.g. optical path length G01N21/21 takes precedence
• CPC Class Codes: G01N 21/412 Index profiling of optical fibres

Abstract

Systems and methods for measuring a profile of a glass sample (300) are disclosed. The method includes scanning a polarization-switched light beam (112PS) through the glass sample and a reference block (320) for different depths into the glass sample to define a transmitted polarization-switched light beam. The method also includes measuring an amount of power in the polarization-switched light beam to form a polarization-switched reference signal (SR), and detecting the transmitted polarization-switched light beam to form a polarization-switched detector signal (SD). The method further includes dividing the polarization-switched detector signal by the polarization-switched reference signal to define a normalized polarization-switched detector signal (SN). Processing the normalized polarization-switched detector signal determines the profile characteristic.

Claims

1. A system for performing a refracted near-field (RNF) measurement of a profile characteristic of a glass sample disposed adjacent a reference block having a top surface, comprising:

a light-source system that generates polarized light;

a polarization-switching system that receives and switches the polarization of the polarized light between first and second orthogonal polarizations to form a polarization-switched light beam;

a reference detector system arranged to receive a portion of the polarization-switched light beam and form a polarization-switched reference detector signal;

an optical system configured to scan the polarized-switched light beam through the glass sample and the reference block at different depths into the glass sample;

a signal detector system arranged to receive, over an angular range within 26°

to 45°

relative to normal incidence, the polarization-switched light beam transmitted through the glass sample and the reference block, and form in response a polarization-switched detector signal; and

a signal-control-and-processing system operably configured to move the reference block and sample and receive and process the polarization-switched reference and detector signals to determine a profile characteristic of the glass sample.

2. The system of claim 1, wherein:

the reference detector system includes a first confocal aperture operably disposed immediately adjacent a reference photodetector; and

the signal detector system includes a first confocal aperture operably disposed immediately adjacent a signal photodetector.

3. The system of claim 1, wherein the signal detector system has a signal photodetector that is located at an axial distance between 80 mm and 200 mm from the top surface of the reference block.

4. The system of claim 1, wherein the signal-control-and-processing system includes:

a computer-controller;

a dual-channel power meter operably connected to the computer-controller, the signal detector system and the reference detector system; and

a master trigger controller operably connected to the computer-controller, the dual-channel power meter and the polarization switching system.

5. The system of claim 1, wherein the optical system includes:

a first aperture stop having a first off-axis aperture;

an objective lens;

a support platform that supports the reference block and glass sample;

a positioning stage operably connected to the support platform and that is operable to move the support platform in three dimensions; and

a second aperture stop having a second off-axis aperture having a size that is adjustable.

6. The system of claim 5, wherein the first off-axis aperture has a wedge shape and the second off-axis aperture has an arcuate shape.

7. The system of claim 1, wherein the detector optical system includes a signal photodetector, a confocal aperture, and a relay optical system, wherein the relay optical system receives and collimates the polarization-switched light beam transmitted through the glass sample and reference block and forms a focused polarization-switched light beam that passes through the confocal aperture and is incident upon a photosensing surface of the signal photodetector.

8. The system of claim 1, wherein the polarization-switching system includes a liquid-crystal variable retarder operably connected to a polarization-switch controller.

9. The system of claim 1, wherein the polarization-switching system switches the polarization of the polarization-switched light beam at a maximum rate of between 10 Hz and 50 Hz.

10. A method of measuring a profile characteristic of a glass sample disposed adjacent a reference block having a top surface, comprising:

scanning a polarization-switched light beam through the glass sample and the reference block for different depths into the glass sample to define a transmitted polarization-switched light beam;

measuring an amount of power in the polarization-switched light beam to form a polarization-switched reference signal;

detecting the transmitted polarization-switched light beam to form a polarization-switched detector signal;

dividing the polarization-switched detector signal by the polarization-switched reference signal to define a normalized polarization-switched detector signal; and

processing the normalized polarization-switched detector signal to determine the profile characteristic of the glass sample.

11. The method of claim 10, wherein the reference block has a top surface, and wherein detecting the transmitted polarization-switched light beam includes receiving the transmitted polarization-switched light beam at a signal photodetector, wherein the signal photodetector resides at an axial distance of between 80 mm and 200 mm from the top of the reference block.

12. The method of claim 11, including focusing the transmitted polarization-switched light beam onto the signal photodetector.

13. The method of claim 11, including passing the transmitted polarization-switched light beam through a confocal aperture arranged immediately adjacent the signal photodetector.

14. The method of claim 10, wherein measuring an amount of power in the polarization-switched light beam included deflecting and detecting a portion of the polarization-switched light beam.

15. The method of claim 10, including further directing the transmitted polarization-switched light beam to be incident upon a signal photodetector at an incident angle of no greater than ±

22.5°

.

16. The method of claim 10, including passing the transmitted polarization-switched light beam through an anti-reflection coating on the top of the reference block, the anti-reflecting coating being configured to minimize differences in reflectivity between orthogonal polarizations of the transmitted polarization-switched light beam.

17. A method of measuring a profile characteristic of a glass sample disposed adjacent a reference block, comprising:

generating a polarization-switched light beam that is switched between orthogonal polarizations at a rate of between 1 Hz and 50 Hz;

measuring an amount of power in the polarization-switched light beam and generating a polarization-switched reference signal, wherein the measured amounts of power in each of the orthogonal polarizations are within 50% of each other;

transmitting the polarization-switched light beam through the glass sample and reference block for different depths into the glass sample;

relaying the transmitted polarization-switched light beam to a signal photodetector using a relay optical system, with the signal photodetector generating a polarization-switched detector signal;

dividing the detector signal by the reference signal to form a normalized detector signal; and

determining the profile characteristic of the glass sample from the normalized detector signal.

18. The method of claim 17, further comprising:

passing the polarization-switched light beam through a first off-axis opening of a first aperture stop prior to passing the polarization-switched light beam through the glass sample;

passing the transmitted polarization-switched light beam through a second off-axis opening of a second aperture stop prior to said relaying of the transmitted polarization-switched light beam.

19. The method of claim 18, wherein the first opening has a wedge shape and the second opening has an arcuate shape and an adjustable azimuthal angular extent.

20. The method of claim 17, wherein the transmitted polarization-switched light beam includes an angular range of within 22.5°

about a central ray, and wherein the transmitted polarization-switched light beam is made incident upon the signal photodetector such that the central ray is substantially normally incident upon the signal photodetector.