Volume dimensioning system and method employing time-of-flight camera

• US 8,854,633 B2
• Filed: 06/29/2012
• Issued: 10/07/2014
• Est. Priority Date: 06/29/2012
• Status: Active Grant

• Current Assignee: Intermec IP Corporation (Honeywell International Inc.)
• Original Assignee: Intermec IP Corporation (Honeywell International Inc.)
• Inventors: Laffargue, Franck, Gillet, Alain, Thuries, Serge
• Primary Examiner(s): PHAM, HOA Q
• Application Number:
  US13/539,006
• Publication Number:
  US 20140002828A1
• Time in Patent Office: 830 Days
• Field of Search: 356601-635, 382/118, 382/154, 382/143, 348/49, 348/164, 348/294, 250/223.R, 250/226, 235/440, 235/454
• US Class Current: 356/627
• CPC Class Codes: G01F 17/00 Methods or apparatus for determining the capacity of containers or cavities, or the volume of solid bodies measuring linear dimensions to determine volume G01B

Abstract

Volume dimensioning employs techniques to reduce multipath reflection or return of illumination, and hence distortion. Volume dimensioning for any given target object includes a sequence of one or more illuminations and respective detections of returned illumination. A sequence typically includes illumination with at least one initial spatial illumination pattern and with one or more refined spatial illumination patterns. Refined spatial illumination patterns are generated based on previous illumination in order to reduce distortion. The number of refined spatial illumination patterns in a sequence may be fixed, or may vary based on results of prior illumination(s) in the sequence. Refined spatial illumination patterns may avoid illuminating background areas that contribute to distortion. Sometimes, illumination with the initial spatial illumination pattern may produce sufficiently acceptable results, and refined spatial illumination patterns in the sequence omitted.

Claims

1. A dimensioning system operable to dimension a target object, comprising

an illumination subsystem operable to successively emit a number of sequences of spatial patterns of illumination toward the target object, each of the sequences including at least an initial spatial illumination pattern and at least one refined spatial illumination pattern subsequent to the respective initial spatial illumination pattern, the refined spatial illumination pattern spatially different than the respective initial spatial illumination pattern;

a sensor positioned to detect illumination returned from at least the target object; and

a control subsystem communicatively coupled to the sensor and communicatively coupled to the illumination subsystem, and which determines an approximate boundary of at least a portion of the target object based at least in part of the detected illumination, determines the refined spatial illumination pattern based at least in part on the determined approximate boundary, causes the illumination subsystem to emit the at least one refined spatial illumination pattern, and determines an at least approximate volume of the target object based at least in part on illumination returned from at least the target object when illuminated by the at least one refined spatial illumination pattern.

2. The dimensioning system of claim 1 wherein the control subsystem determines the refined spatial illumination pattern based at least in part on the determined approximate boundary to reduce illumination of surfaces that are not part of the target object.

3. The dimensioning system of claim 1 wherein the approximate boundary includes at least one edge feature in an image of an illuminated area in which the target object is located and the control subsystem further determines at least one area beyond the approximate edge which contributes to distortion and determines the refined spatial illumination pattern to reduce illumination of the at least one area which contributes to distortion.

4. The dimensioning system of claim 1 wherein the sequences each include one initial spatial illumination pattern of modulated illumination and at least some of the sequences include at least two refined spatial illumination patterns of modulated illumination subsequent to the respective initial spatial illumination pattern, the refined spatial illumination patterns spatially different than the respective initial spatial illumination pattern and spatially different from one another.

5. The dimensioning system of claim 4 wherein a first one of the refined spatial illumination patterns has an area smaller than an illumination area of the respective initial spatial illumination pattern, and a second one of the refined spatial illumination patterns, subsequent to the first one of the refined spatial illumination patterns, has an illumination area smaller than the illumination area of the first one of the refined spatial illumination patterns.

6. The dimensioning system of claim 4 wherein the control subsystem causes the illumination subsystem to apply a temporal modulation of at least one of intensity or wavelength to the initial spatial illumination pattern and the at least two refined spatial illumination patterns.

7. The dimensioning system of claim 1 wherein the illumination subsystem includes an illumination source selectively actuatable to emit a number of two-dimensional spatial illumination patterns.

8. The dimensioning system of claim 1 wherein the illumination subsystem includes an illumination source actuatable to emit illumination and a filter actuatable to selectively block and selectively pass the emitted illumination as a number of two-dimensional spatial illumination patterns.

9. The dimensioning system of claim 1 wherein the illumination subsystem includes a laser illumination source and at least one scanning reflector operable to produce a two-dimensional scanning spatial pattern.

10. The dimensioning system of claim 1 wherein the illumination subsystem includes at least one of a liquid crystal display, a liquid crystal on silicon device or a digital micromirror device.

11. The dimensioning system of claim 1 wherein the sensor is a two-dimensional sensor is positioned to detect the illumination returned from the target object without use of parallax with another sensor and the control subsystem performs a time-of-flight analysis.

12. A method of operation in a dimensioning system to dimension a target object, the method comprising

emitting an initial spatial illumination pattern of modulated illumination toward the target object by an illumination subsystem operable to successively emit a number of sequences of spatial patterns of illumination which are modulated, each of the sequences including at least the initial spatial illumination pattern and at least one refined spatial illumination pattern of modulated illumination subsequent to the respective initial spatial illumination pattern, the at least one refined spatial illumination pattern spatially different than the respective initial illumination pattern;

detecting by a sensor illumination returned from at least the target object; and

determining by a control subsystem an approximate boundary of at least a portion of the target object based at least in part on the detected illumination;

determining by the control subsystem the at least one refined spatial illumination pattern based at least in part on the determined approximate boundary;

causing the illumination subsystem to emit the at least one refined spatial illumination pattern; and

determining by the control subsystem an at least approximate three-dimensional volume of the target object based at least in part on illumination returned from at least the target object when illuminated by the at least one refined spatial illumination pattern.

13. The method of claim 12 wherein determining the refined spatial illumination pattern based at least in part on the determined approximate boundary includes determining the at least one refined spatial illumination pattern to reduce illumination of surfaces that are not part of the target object.

14. The method of claim 12 wherein the approximate boundary includes at least one edge feature in an image of an illuminated area in which the target object is located, and further comprising

determining by the control subsystem at least one area beyond the approximate edge which contributes to distortion and wherein determining the at least one refined spatial illumination pattern includes determining the at least one refined spatial illumination pattern that reduces illumination of the at least one area which contributes to distortion.

15. The method of claim 12 wherein at least some of the sequences include at least a first and a second refined spatial illumination pattern subsequent to the respective initial spatial illumination pattern, the first and the second refined spatial illumination patterns spatially different than the respective initial spatial illumination pattern and different from one another, and wherein determining the at least one refined spatial illumination pattern based at least in part on the determined approximate boundary includes successively determining the first refined spatial illumination pattern and the second refined spatial illumination pattern, and causing the illumination subsystem to emit the at least one refined spatial illumination pattern includes causing the illumination subsystem to successively emit the first refined spatial illumination pattern and the second refined spatial illumination pattern, each of the first and the second refined spatial illumination patterns being modulated to be distinguishable from any ambient light.

16. The method of claim 15 wherein causing the illumination subsystem to successively emit the first refined spatial illumination pattern includes causing the illumination subsystem to emit the first refined spatial illumination pattern having an illumination area smaller than an illumination area of the respective initial spatial illumination pattern, and causing the illumination subsystem to successively emit the second refined spatial illumination pattern includes causing the illumination subsystem to successively emit the second refined spatial illumination pattern having an illumination area smaller than the illumination area of the first refined spatial illumination pattern.

17. The method of claim 12 wherein causing the illumination subsystem to emit the at least one refined spatial illumination pattern includes causing an illumination source to emit a number of two-dimensional illumination patterns of temporally modulated illumination.

18. The method of claim 12 wherein causing the illumination subsystem to emit the at least one refined spatial illumination pattern includes causing an illumination source to emit illumination and a filter to selectively block and selectively pass the emitted illumination as a number of two-dimensional illumination patterns.

19. The method of claim 12 wherein causing the illumination subsystem to emit the at least one refined spatial illumination pattern includes causing a laser illumination source and at least one scanning reflector to produce a two dimensional scanning pattern.

20. The method of claim 12 wherein causing the illumination subsystem to emit the at least one refined spatial illumination pattern includes supplying control signals to at least one of a liquid crystal display, a liquid crystal on silicon device or a digital micromirror device.

21. The method of claim 12 wherein determining an at least approximate three-dimensional volume of the target object based at least in part on illumination returned from at least the target object when illuminated by the at least one refined spatial illumination pattern includes determining the at least approximate three-dimensional volume of the target object based at least in part on a time-of-flight analysis of at least the emitted at least one refined spatial illumination pattern and the illumination returned from the target object when illuminated by the respective at least one refined spatial illumination pattern.

22. A time-of-flight based dimensioning system operable to dimension a target object, comprising

an illumination subsystem operable to successively emit a number of sequences of two-dimensional patterns of modulated illumination toward the target object, each of the sequences including at least an initial two-dimensional pattern of modulated illumination and at least one refined two-dimensional pattern of modulated illumination subsequent to the respective initial pattern of modulated illumination, the at least one refined two-dimensional pattern of modulated illumination spatially different than the respective initial two-dimensional pattern of modulated illumination;

a two-dimensional image sensor positioned to detect illumination returned from at least the target object; and

a control subsystem communicatively coupled to the image sensor to receive image information therefrom representative of the returned illumination, and which identifies edge features in the image information that correspond to physical edges of at least a portion of the target object, based at least in part on the identified edge features determines the at least one refined two-dimensional pattern of modulated illumination to reduce multipath reflection, causes the illumination subsystem to emit the at least one refined two-dimensional pattern of modulated illumination, and determines an at least approximate three-dimensional volume of the target object based at least in part on illumination returned from at least the target object when illuminated by the at least one refined two-dimensional pattern of modulated illumination.

23. The dimensioning system of claim 22 wherein the control subsystem further determines at least one area beyond the identified edge features which contributes to the multipath reflection and determines the refined two-dimensional pattern of modulated illumination to reduce illumination of the at least one area which contributes to multipath reflection.

24. The dimensioning system of claim 22 wherein the control subsystem determines at least two refined two-dimensional patterns of modulated illumination for each of at least one of the sequences, the at least two refined two-dimensional patterns of modulated illumination spatially different than the respective initial two-dimensional pattern of modulated illumination, a first one of the refined two-dimensional patterns of modulated illumination having a respective illumination area smaller than an respective illumination area of the initial two-dimensional pattern of modulated illumination and a second one of the refined two-dimensional patterns of modulated illumination having a respective illumination area smaller than the respective illumination area of the first one of the two-dimensional patterns of modulated illumination.

25. The dimensioning system of claim 22 wherein the control subsystem determines the at least approximate three-dimensional volume of the target object based at least in part on a time-of-flight analysis of at least the emitted at least one refined two-dimensional pattern of modulated illumination and the illumination returned from the target object when illuminated by the respective at least one refined two-dimensional pattern of modulated illumination.