System and method for detecting sensor leakage

• US 8,860,429 B2
• Filed: 04/28/2010
• Issued: 10/14/2014
• Est. Priority Date: 04/28/2009
• Status: Active Grant

• Current Assignee: National Cheng KUNG University (Government of The Republic of China), Textron Innovations Incorporated (Textron Inc)
• Original Assignee: Textron Innovations Incorporated (Textron Inc)
• Inventors: Froman, Gary S.
• Primary Examiner(s): Nguyen, Tung X
• Assistant Examiner(s): Astacio-Oquendo, Giovanni
• Application Number:
  US13/266,605
• Publication Number:
  US 20120038366A1
• Time in Patent Office: 1,630 Days
• Field of Search: 324/537, 324/522, 324/601, 324/694, 324/698, 324/700, 324/763
• US Class Current: 324/537
• CPC Class Codes: G01R 31/008 on air- or spacecraft, railway rolling stock or sea-going vessels
• CPC Class Codes: G01R 31/2829 Testing of circuits in sensor or actuator systems testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844
• CPC Class Codes: G01R 31/52 Testing for short-circuits, leakage current or ground faults

Abstract

A test system for testing a sensor system includes a high-impedance resistor for forming a voltage divider with any corrosion or foreign substance that might be present between a signal conductor and a ground conductor. While a voltage is applied across the voltage divider, the voltage can be measured across the high-impedance resistor for determining whether an undesirable amount of conductance exists between the signal wire and ground. The test system also includes switching means for switching between any number of signal wires of a system undergoing testing.

Claims

1. A sensor test system, comprising:

a case configured to house a circuit;

a power source for producing a voltage;

a cable electrically connecting a first sensor to the circuit;

the first sensor comprising multiple connector pins and a grounded connector shell;

wherein the circuit comprises;

a high-impedance resistor connected between the power source and a common connection of the multiple connector pins such that the connector pins remain at a electrical potential;

a first voltage test point and a second voltage test point across the high-impedance resistor;

a common return line from the grounded connector shell to the power source, such that each of the multiple connector pins remain at the same electrical potential having a single voltage source and a single return path, the voltage produced from the power source renders a contaminant between the connector pins and the connector shell conductive, in that the contaminant provides conductive path between the connector pins and the grounded connector shell, while the contaminant also provides a contaminant resistance;

wherein interpretation of a measured voltage between the first voltage test point and the second voltage test point provides an indication of the contaminant due to the contaminant resistance affecting the measured voltage.

2. The sensor test system of claim 1, wherein the voltage is approximately 28 volts.

3. The sensor test system of claim 1, wherein the connector pins are electrically tied together within the circuit so as to prevent damage during a test procedure.

4. The sensor test system of claim 1, further comprising:

a voltmeter for measuring the voltage across the first voltage test point and the second voltage test point.

5. The sensor test system of claim 4, wherein the voltmeter is external to the case.

6. The sensor test system of claim 1, further comprising:

a second sensor connected to the circuit with the cable;

a switch for selectively changing electrical connectivity of the circuit between the first sensor and the second sensor.

7. The sensor test system of claim 1, wherein the high-impedance resistor is between 100 k Ohms and 1 M Ohms.

8. The sensor test system of claim 1, wherein the indication of the contaminant represents a quantity of the contaminant.

9. The sensor test system of claim 1, wherein the indication of the contaminant represents a presence of the contaminant.

10. The sensor test system of claim 1, further comprising:

a built-in processor for determining whether the indication of the contaminant represents an unacceptable amount of the contaminant.

11. A method for detecting a leakage in a sensor with a tester, comprising:

using a circuitry in the tester to electrically couple a plurality of connector pins, the connector pins being located in a connector shell;

applying a source voltage to the circuitry, the circuitry including a high-impedance resistor located between the plurality of connector pins and the source voltage, a common connection of the multiple connector pins such that the connector pins remain at a same electrical potential having a single voltage source and a single return path, the circuitry being configured such that a contamination between the connector pins and the connector shell becomes conductive upon applying the source voltage;

taking a voltage reading across the high-impedance resistor; and

interpreting the voltage reading so as to determine an amount of the leakage resulting from the contamination.

12. The method according to claim 11, wherein the interpreting the voltage reading includes using a look-up table, the look-up table having predetermined relationships between the voltage readings and a resistance, the resistance being an indication of an extent of the leakage.

13. The method according to claim 11, wherein the interpreting the voltage reading includes using a processor in the tester, the processor being configured to use an internal look-up table for calculating an extent of the leakage.

14. The method according to claim 13, wherein the processor is configured to output a pass/fail reading on a display of the tester.

15. The method according to claim 11, wherein the taking a voltage reading includes using an external volt-meter to take the voltage reading across the high-impedance resistor.

16. The method according to claim 11, wherein the applying the source voltage to the circuitry includes switching on a power switch which applies the source voltage from at least one battery in the tester.