Transistor, method of manufacturing the transistor and electronic device including the transistor
First Claim
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1. A transistor comprising:
- a channel layer including an oxide;
a source electrode and a drain electrode configured to separately contact both ends of the channel layer, the source electrode covering a first region of the channel layer and the drain electrode covering a second region of the channel layer;
a gate corresponding to the channel layer;
a gate insulating layer between the channel layer and the gate, the gate insulating layer including a silicon nitride layer and a silicon oxide layer which are sequentially stacked from the gate; and
a passivation layer on the channel layer, the source and drain electrodes, the gate insulating layer, and the gate, the passivation layer including a silicon oxide layer, a silicon oxynitride layer, and a silicon nitride layer sequentially stacked,wherein the silicon oxynitride layer includes oxygen through an entire thickness,wherein a portion of the channel layer between the first region and the second region, which is not covered by the source electrode and the drain electrode, is a plasma-treated region that is treated with plasma including oxygen, and the portion of the channel layer includes oxygen provided by the plasma, andwherein the portion of the channel layer between the first region and the second region has an oxygen concentration that is different from the oxygen concentration of a portion of the channel layer that is covered by the source electrode and the drain electrode.
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Abstract
Provided are a transistor, a method of manufacturing the transistor, and an electronic device including the transistor. The transistor may include a passivation layer on a channel layer, a source, a drain, and a gate, wherein the component of the passivation layer is varied in a height direction. The passivation layer may have a multi-layer structure including a silicon oxide layer, a silicon oxynitride layer, and a silicon nitride layer sequentially stacked. The channel layer may include an oxide semiconductor.
21 Citations
25 Claims
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1. A transistor comprising:
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a channel layer including an oxide; a source electrode and a drain electrode configured to separately contact both ends of the channel layer, the source electrode covering a first region of the channel layer and the drain electrode covering a second region of the channel layer; a gate corresponding to the channel layer; a gate insulating layer between the channel layer and the gate, the gate insulating layer including a silicon nitride layer and a silicon oxide layer which are sequentially stacked from the gate; and a passivation layer on the channel layer, the source and drain electrodes, the gate insulating layer, and the gate, the passivation layer including a silicon oxide layer, a silicon oxynitride layer, and a silicon nitride layer sequentially stacked, wherein the silicon oxynitride layer includes oxygen through an entire thickness, wherein a portion of the channel layer between the first region and the second region, which is not covered by the source electrode and the drain electrode, is a plasma-treated region that is treated with plasma including oxygen, and the portion of the channel layer includes oxygen provided by the plasma, and wherein the portion of the channel layer between the first region and the second region has an oxygen concentration that is different from the oxygen concentration of a portion of the channel layer that is covered by the source electrode and the drain electrode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of manufacturing a transistor, the method comprising:
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preparing a transistor including a channel layer, a source electrode and a drain electrode separately contacting both ends of the channel layer, a gate corresponding to the channel layer, and a gate insulating layer between the channel layer and the gate, the channel layer including an oxide and the gate insulating layer including a silicon nitride material layer and a silicon oxide material layer sequentially stacked from the gate, the source electrode covering a first region of the channel layer and the drain electrode covering a second region of the channel layer; and forming a passivation layer on the channel layer, wherein forming the passivation layer includes, forming a silicon oxide layer on the transistor, forming a silicon oxynitride layer on the silicon oxide layer, wherein the silicon oxynitride layer includes oxygen through an entire thickness, and forming a silicon nitride layer on the silicon oxynitride layer, and wherein a portion of the channel layer between the first region and the second region, which is not covered by the source electrode and the drain electrode, is a plasma-treated region treated with plasma including oxygen, and the portion of the channel layer includes oxygen provided by the plasma, and wherein the portion of the channel layer between the first region and the second region has an oxygen concentration that is different from the oxygen concentration of a portion of the channel layer that is covered by the source electrode and the drain electrode. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A transistor comprising:
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a channel layer including an oxide; an etch stop layer on the channel layer; a source electrode and a drain electrode configured to separately contact both ends of the channel layer; a gate corresponding to the channel layer; a gate insulating layer between the channel layer and the gate, the gate insulating layer including a silicon nitride layer and a silicon oxide layer which are sequentially stacked from the gate; and a passivation layer covering the channel layer, the source and drain electrodes, the gate insulating layer, and the gate, the passivation layer including a silicon oxide layer, a silicon oxynitride layer, and a silicon nitride layer sequentially stacked, wherein the silicon oxynitride layer includes oxygen through an entire thickness, wherein the channel layer is above the gate, the source electrode and the drain electrode are on both ends of the etch stop layer, the source electrode covers an upper surface of a first end of the etch stop layer, and the drain electrode covers an upper surface of a second end of the etch stop layer, wherein a portion of the channel layer between the first region and the second region, which is not covered by the source electrode and the drain electrode, is a plasma-treated region that is treated with plasma including oxygen, and the portion of the channel layer includes oxygen provided by the plasma, and wherein the portion of the channel layer between the first region and the second region has an oxygen concentration that is different from the oxygen concentration of a portion of the channel layer that is covered by the source electrode and the drain electrode.
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Specification