Method for fast, robust, multi-dimensional pattern recognition
First Claim
1. In probe-based pattern matching, a method for synthetic training of a model of a pattern, the method comprising:
- providing a machine vision system that includes a processor that is programmed to perform the steps of;
placing a plurality of positive probes at selected points along a boundary of the pattern;
identifying at least one straight segment of the boundary of the pattern;
extending at least one straight segment of the boundary to provide an imaginary straight segment;
placing a plurality of negative probes at selected points along the imaginary straight segment, each negative probe having a negative weight.
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Abstract
A method and system for probe-based pattern matching including an apparatus for synthetic training of a model of a pattern. The apparatus comprises a sensor for obtaining an image of the pattern and a processor for receiving the image of the pattern from the sensor and running a program. In the steps performed by the program a boundary of the pattern in the image is identified. A plurality of positive probes are placed at selected points along the boundary of the pattern and at least one straight segment of the boundary of the pattern is identified. The at least one straight segment of the boundary is extended to provide an imaginary straight segment and a plurality of negative probes are placed at selected points along the imaginary straight segment, where each negative probe has a negative weight.
304 Citations
16 Claims
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1. In probe-based pattern matching, a method for synthetic training of a model of a pattern, the method comprising:
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providing a machine vision system that includes a processor that is programmed to perform the steps of; placing a plurality of positive probes at selected points along a boundary of the pattern; identifying at least one straight segment of the boundary of the pattern; extending at least one straight segment of the boundary to provide an imaginary straight segment;
placing a plurality of negative probes at selected points along the imaginary straight segment, each negative probe having a negative weight. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. In probe-based pattern matching, an apparatus for synthetic training of a model of a pattern, the apparatus comprising:
- a sensor for obtaining an image of the pattern;
a processor receiving the image of the pattern from the sensor and running a program to perform the steps of;(i) identifying a boundary of the pattern in the image; (ii) placing a plurality of positive probes at selected points along the boundary of the pattern; (iii) identifying at least one straight segment of the boundary of the pattern; (iv) extending at least one straight segment of the boundary to provide an imaginary straight segment; and (v) placing a plurality of negative probes at selected points along the imaginary straight segment, each negative probe having a negative weight. - View Dependent Claims (14, 15, 16)
- a sensor for obtaining an image of the pattern;
Specification