Non-destructive stress profile determination in chemically tempered glass

• US 8,873,028 B2
• Filed: 06/29/2011
• Issued: 10/28/2014
• Est. Priority Date: 08/26/2010
• Status: Expired due to Fees

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Sheldon, Eli, Byun, Edward, Lintz, Michael, Gorasia, Jayesh, Cherney, Raphael
• Primary Examiner(s): Lyons, Michael A
• Assistant Examiner(s): Ayub, Hina F
• Application Number:
  US13/172,709
• Publication Number:
  US 20120050747A1
• Time in Patent Office: 1,217 Days
• Field of Search: 356/35.5, 356/479, 356/497
• US Class Current: 356/35.5
• CPC Class Codes: C03C 21/002 to perform ion-exchange between alkali ions C03C21/005 takes precedence
• CPC Class Codes: G01B 2290/45 Multiple detectors for detecting interferometer signals
• CPC Class Codes: G01B 2290/70 Using polarization in the interferometer
• CPC Class Codes: G01B 9/02014 by using pulsed light
• CPC Class Codes: G01B 9/02027 Two or more interferometric channels or interferometers
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
• CPC Class Codes: G01L 5/0047 measuring forces due to residual stresses

Abstract

Apparatus, systems and methods for improving strength of thin cover glass for electronic devices are disclosed. Optical coherence tomography analysis may reveal fine details of a residual stress profile within chemically strengthened cover glass. One or more parameters of chemical strengthening treatments may be adjusted, based upon the analysis of the residual stress profile.

Claims

1. An apparatus comprising:

a polarimetric optical coherence tomography device configured to use ultrashort polarized probe pulses to analyze with depth resolution of about one micron or finer a cover glass having a residual stress depth profile;

a fixture configured to align the cover glass in an optical coupling with the ultrashort polarized probe pulses of the polarimetric optical coherence tomography device, wherein the polarimetric optical coherence tomography device comprises a time domain polarimetric optical coherence tomography device configured to analyze with depth resolution of about one micron or finer the residual stress depth profile of the cover glass; and

a chemical processing bath having parameters that are adjustable based upon depth resolved analysis of the residual stress depth profile of the cover glass.

2. An apparatus as in claim 1 wherein:

a housing for a consumer electronic device is attached to the cover glass and electrical components of the consumer electronic device are provided at least partially internal to said housing; and

the fixture is configured to couple to the housing and to align the cover glass in the optical coupling with the polarimetric optical coherence tomography device.

3. An apparatus as recited in claim 2, wherein:

said consumer electronic device is a cell phone, a portable media player, a personal digital assistant, or a remote control device; and

the fixture is configured to couple to at least one of the cell phone, the portable media player, the personal digital assistant, or the remote control device and to align the cover glass in the optical coupling with the polarimetric optical coherence tomography device.

4. An apparatus as in claim 1 wherein the polarimetric optical coherence tomography device is configured to receive signal pulses from the cover glass in response to the ultrashort polarized probe pulses.

5. An apparatus as in claim 1 wherein the chemical processing bath comprises a chemical strengthening bath having parameters that are adjustable based upon depth resolved analysis of the residual stress depth profile of the cover glass.

6. An apparatus as in claim 1 wherein:

the cover glass comprises double ion exchanged glass; and

the polarimetric optical coherence tomography device is configured to analyze the residual stress depth profile of the double ion exchanged glass of the cover glass.

7. An apparatus as in claim 1 wherein:

the residual stress depth profile of the cover glass is comprises a substantially non-monotonic residual stress depth profile; and

the polarimetric optical coherence tomography device is configured to analyze with depth resolution the substantially non-monotonic residual stress depth profile of the cover glass.

8. An apparatus as in claim 1 wherein:

the residual stress depth profile comprises an increasing compression stress profile extending inwardly from surfaces of the cover glass, for arresting cracks as the cracks attempt to propagate from the surfaces of the cover glass, deeper into the cover glass; and

the polarimetric optical coherence tomography device is configured to analyze with depth resolution the increasing compression stress profile extending inwardly from surfaces of the cover glass.

9. An apparatus as in claim 1 wherein:

the residual stress depth profile comprises a compression stress profile having a submerged peak below a surface of the cover glass; and

the polarimetric optical coherence tomography device is configured to analyze with depth resolution the compression stress profile having the submerged peak below the surface of the cover glass.

10. An apparatus as in claim 1 wherein:

the residual stress depth profile comprises an increasing compression stress profile extending inwardly from a surface of the cover glass to a submerged compression stress peak, and further comprises a decreasing compression stress profile extending from the submerged compression stress peak to a central region of the cover glass;

the polarimetric optical coherence tomography device is configured to analyze with depth resolution the increasing compression stress profile extending inwardly from the surface of the cover glass to the submerged compression stress peak; and

the polarimetric optical coherence tomography device is configured to analyze with depth resolution the decreasing compression stress profile extending from the submerged compression stress peak to a central region of the cover glass.

11. An apparatus as in claim 1 wherein:

the residual stress depth profile comprises a compression stress profile having a submerged profile peak at a depth below a surface of the cover glass, and the depth of the submerged profile peak is substantially within a range of approximately ten to thirty microns; and

the polarimetric optical coherence tomography device is configured to analyze with depth resolution the submerged profile peak substantially within the range of approximately ten to thirty microns.

12. A method for depth resolved stress profile analysis comprising:

optically coupling a time domain optical coherence tomography device to a cover glass having a stress depth profile within the cover glass; and

determining depth resolved analysis of the stress depth profile of the cover glass.

13. A method as recited in claim 12 further comprising introducing the stress depth profile into the cover glass.

14. A method as recited in claim 12 further comprising chemically strengthening the cover glass to introduce the stress depth profile into the cover glass.

15. A method as in claim 12 wherein the time domain optical coherence tomography device comprises a time domain polarimetric optical coherence tomography device.

16. A method as in claim 12 further comprising adjusting at least one member of a set parameters of a chemical strengthening process based upon the depth resolved analysis of the stress depth profile of the cover glass.

17. A method as recited in claim 12 wherein the determining comprises determining the depth resolved analysis of the stress depth profile of the cover glass in substantially less than approximately fifteen seconds.

18. A method as recited in claim 12 wherein the determining comprises determining the depth resolved analysis of the stress depth profile of the cover glass with a depth resolution extending into the cover glass of about one micron or finer.

19. A method as recited in claim 12 wherein the determining comprises determining the depth resolved analysis of the stress depth profile of the cover glass with a stress resolution of about one Mega-Pascal or finer.

20. A non-transitory computer readable medium including at least computer program code stored thereon for depth resolved stress profile analysis of a cover glass having a stress depth profile within the cover glass, said computer readable medium comprising:

computer program code for receiving depth resolved polarization dependent time domain interferogram data from detectors optically coupled to the cover glass; and

computer program code for determining a depth resolved analysis of the stress depth profile of the cover glass.

21. A non-transitory computer readable medium as recited in claim 20 further comprising:

computer program code for generating birefringent phase retardation data from the depth resolved polarization dependent time domain interferogram data; and

computer program code for analyzing the birefringent phase retardation data.

22. A method for controlling parameters of chemical processing for strengthening cover glass using depth resolved stress profile analysis comprising:

strengthening cover glass using a chemical strengthening process according to a first set of parameters, so as to introduce a stress profile within the cover glass;

pulse illuminating the cover glass to generate signal pulses from the cover glass;

determining from the signal pulses a depth resolved analysis of the stress profile of the cover glass; and

adjusting at least one member of the set parameters of the chemical strengthening process based upon the depth resolved analysis of the stress profile of the cover glass.

23. An apparatus for depth resolved stress profile analysis comprising:

A source of ultrashort illumination pulses;

a splitter for splitting the ultrashort illumination pulses into probe pulses and reference pulses;

a cover glass having a stress depth profile within the cover glass, wherein the cover glass is optically coupled to the splitter for receiving the probe pulses and for generating signal pulses in response to the probe pulses;

a polarization splitter configured to split the reference pulses and the signal pulses depending upon polarization thereof; and

a time domain analyzer configured to determine a depth resolved analysis of the stress depth profile of the cover glass based upon the reference pulses and signal pulses.