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Ensuring sample adequacy using turbidity light scattering techniques

  • US 8,877,507 B2
  • Filed: 10/09/2009
  • Issued: 11/04/2014
  • Est. Priority Date: 04/06/2007
  • Status: Active Grant
First Claim
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1. An automated method for assuring sample adequacy, the method comprising:

  • providing a sample in a testing container;

    activating an illumination source to pass an illumination beam through the testing container and into the sample, wherein the illumination beam travels upwards in a vertical direction as it passes through the testing container;

    detecting an intensity of an emitted beam, the emitted beam comprising at least a portion of the illumination beam that has been scattered by the sample;

    generating a reference beam by transmitting a portion of the illumination beam that is between the illumination source and the testing container along a reference beam path located below and outside the testing container;

    measuring an intensity of the reference beam using a reference detector;

    generating a sample turbidity measurement based on the intensity of the emitted beam; and

    determining, based on the sample turbidity measurement, an adequacy of the sample to provide accurate results in a primary test of the sample;

    conducting the primary test of the sample to obtain a primary test result;

    evaluating the primary test result to determine whether the primary test result is a negative primary test result; and

    reporting the negative primary test result only if the sample was determined to be adequate to provide accurate results in the primary test of the sample;

    wherein the testing container is one of a plurality of testing containers in a tube unit, the tube unit comprising a frame extending horizontally along a longitudinal axis with the plurality of testing containers connected to the frame and arranged in a line along the longitudinal axis, and wherein each one of the plurality of testing containers extends downward in the vertical direction below the frame; and

    wherein the emitted beam is detected by a sample detector positioned along a vertical extent of the testing container, wherein the sample detector is positioned at the end of an emitted beam path, and wherein the emitted beam path extends in a plane that is perpendicular to the vertical direction and is oriented at a non-perpendicular angle with respect to the longitudinal axis, to thereby reduce the likelihood that the emitted beam will pass through a scratched portion of the testing container.

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