Obscured feature detector with pattern matching

• US 8,884,633 B2
• Filed: 03/03/2011
• Issued: 11/11/2014
• Est. Priority Date: 03/04/2010
• Status: Active Grant

• Current Assignee: Franklin Sensors Inc.
• Original Assignee: Franklin Sensors Inc.
• Inventors: Dorrough, David M.
• Primary Examiner(s): NGUYEN, HOAI AN D
• Application Number:
  US13/040,224
• Publication Number:
  US 20110215817A1
• Time in Patent Office: 1,349 Days
• Field of Search: 324/663, 324/658, 324/649, 324/600, 324/326, 324/66, 324/67, 333/54, 333/32, 332/86, 336/66
• US Class Current: 324/663
• CPC Class Codes: G01N 27/22 by investigating capacitance
• CPC Class Codes: G01N 27/221 by investigating the dielectric properties using microwaves G01N22/00; measuring loss factors or dielectric constants per se G01R27/26
• CPC Class Codes: G01R 27/26 Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24
• CPC Class Codes: G01V 3/08 operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices with electromagnetic waves G01V3/12
• CPC Class Codes: G01V 3/15 specially adapted for use during transport, e.g. by a person, vehicle or boat

Abstract

A surface-conforming obscured feature detector includes a plurality of sensor plates, each having a capacitance that varies based on the dielectric constant of the materials that compose the surrounding objects and the proximity of those objects. A sensing circuit is coupled to the sensor plates 32 to measure the capacitances of the sensor plates. A controller is coupled to the sensing circuit to analyze the capacitances measured by the sensing circuit. One or a plurality of indicators are coupled to the controller, and are selectively activated to identify the location of an obscured feature behind a surface.

Claims

1. An obscured feature detector comprising:

a plurality of sensor plates, each having a capacitance that varies based on;

(a) the proximity of the sensor plate to one or more surrounding objects, and (b) the dielectric constant(s) of the surrounding object(s);

a sensing circuit coupled to the sensor plates, the circuit being configured to measure the capacitances of the sensor plates with the obscured feature detector in a stationary position, the set of measured capacitance values comprising a measured reading pattern;

a controller comprising non-volatile memory storing a predetermined reading pattern comprising a plurality of capacitance values, and a pattern matching module configured to compare the measured reading pattern with the predetermined reading pattern, and determine whether the predetermined reading pattern matches the measured reading pattern; and

one or a plurality of indicators coupled to the controller, each indicator capable of toggling between a deactivated state and an activated state,

wherein the controller is configured to activate one or more of the indicators to identify a location of an obscured feature.

2. The obscured feature detector of claim 1, wherein the predetermined reading patterns has values that are consistent with the detector performing a reading on sheetrock with a single stud behind the sheetrock.

3. The obscured feature detector of claim 1, wherein the predetermined reading patterns has values that are consistent with the detector performing a reading on sheetrock with two studs behind the sheetrock, the two studs separated by a distance of at least about two inches.

4. The obscured feature detector of claim 1, wherein the obscured feature detector comprises at least four sensor plates.

5. The obscured feature detector of claim 1, wherein the indicators are LEDs.

6. The obscured feature detector of claim 1, wherein the pattern matching module is configured to compare the values of the measured reading pattern to the values of the predetermined reading pattern.

7. The obscured feature detector of claim 1, wherein the pattern matching module is configured to compare the slopes of the measured reading pattern to the slopes of the predetermined reading pattern, wherein the slopes of the measured reading pattern are calculated by comparing neighboring measured capacitance values and the slopes of the predetermined reading pattern are calculated by comparing neighboring values.

8. The obscured feature detector of claim 1, wherein the predetermined reading pattern comprises a plurality of predetermined reading patterns comprising at least 30 unique reading patterns.

9. The obscured feature detector of claim 1, wherein each of the sensor plates are substantially the same size.

10. The obscured feature detector of claim 8, wherein the plurality of predetermined reading patterns includes multiple reading patterns corresponding to a single stud, where each of the multiple reading patterns corresponds to a single stud in a different location.

11. The obscured feature detector of claim 1, wherein the non-volatile memory stores a plurality of predetermined reading patterns.

12. The obscured feature detector of claim 8, wherein the pattern matching module is configured to calculate the plurality of predetermined reading patterns and store them in memory when the obscured feature detector is initialized.

13. The obscured feature detector of claim 8, wherein the pattern matching module is configured to calculate the plurality of predetermined reading patterns and store them in memory when a calibration routine in executed.

14. The obscured feature detector of claim 8, wherein the pattern matching module is configured to calculate the plurality of predetermined reading patterns in real-time, when the obscured feature detector is in use.

15. A method for determining the location of obscured features behind a surface, the method comprising:

placing an obscured feature detector in a stationary position on the surface, the obscured feature detector having a plurality of sensor plates arranged in an array;

measuring capacitance readings sensed in a plurality of regions, each region corresponding to an area surrounding one or more of the sensor plates, the set of capacitance readings forming a measured reading pattern;

comparing the measured reading pattern to each of a plurality of predetermined reading patterns, each predetermined reading pattern comprising a set of capacitance values and being stored in non-volatile memory in a controller;

identifying, based upon comparisons of the measured reading pattern to the predetermined reading patterns, the predetermined reading pattern that best matches the measured reading pattern, each predetermined reading pattern being associated with one or more indicators; and

activating the one or more indicators associated with the predetermined reading pattern that best matches the measured reading pattern.

16. The method of claim 15, wherein at least one of the predetermined reading patterns has values that are consistent with the detector performing a reading on sheetrock with a single stud behind the sheetrock.

17. The method of claim 15, wherein at least one of the predetermined reading patterns has values that are consistent with the detector performing a reading on sheetrock with two studs behind the sheetrock, the two studs being located adjacent to each other.

18. The method of claim 15, wherein at least one of the predetermined reading patterns has values that are consistent with the detector performing a reading on sheetrock with two studs behind the sheetrock, the two studs being separated by a distance of at least about two inches.

19. The method of claim 15, wherein at least one predetermined reading pattern is associated with one or more indicators spanning a distance of at least about one and one half inches.

20. The method of claim 15 wherein at least one predetermined reading pattern is associated with one or more indicators that indicate the edges of an obscured feature.