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Dynamic prediction of risk levels for manufacturing operations through leading risk indicators

  • US 8,884,759 B2
  • Filed: 09/11/2012
  • Issued: 11/11/2014
  • Est. Priority Date: 09/12/2011
  • Status: Active Grant
First Claim
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1. A method for identifying a hidden process near-miss in a plant/facility operation, the method comprising:

  • collecting measured data associated with at least one process variable, although without related adverse incident;

    collecting long-term process data for a period preceding the collecting measured data wherein the long term process data is automatically updated over time;

    determining normal values or value ranges, or combinations thereof, based on long-term process data, and comparing the measured data associated with the at least one process variable with the collected long-term process data to determine deviation there between measured data relative to determined normal value(s), wherein a measure or extent, or both, of the deviation identifies at least one hidden process near-miss.

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