X-ray tomographic inspection system for the identification of specific target items
First Claim
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1. A system for generating a sinogram, comprising:
- a plurality of X-ray source points arranged around a scanning region;
a first set of detectors arranged to detect X-rays transmitted through the scanning region;
a second set of detectors arranged to detect X rays scattered from the scanning region; and
a processing system for receiving unattenuated X-ray beam intensity data from the plurality of X-ray source points, for receiving attenuated X-ray beam intensity data from the first set of detectors, and for generating said sinogram from a function of said unattenuated X-ray beam intensity data and attenuated X-ray beam intensity data, wherein said sinogram comprises data arranged in an array with a pixel number along one axis and a source angle, corresponding to one of said plurality of X-ray source points, along a second axis.
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Abstract
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening.
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Citations
11 Claims
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1. A system for generating a sinogram, comprising:
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a plurality of X-ray source points arranged around a scanning region; a first set of detectors arranged to detect X-rays transmitted through the scanning region; a second set of detectors arranged to detect X rays scattered from the scanning region; and a processing system for receiving unattenuated X-ray beam intensity data from the plurality of X-ray source points, for receiving attenuated X-ray beam intensity data from the first set of detectors, and for generating said sinogram from a function of said unattenuated X-ray beam intensity data and attenuated X-ray beam intensity data, wherein said sinogram comprises data arranged in an array with a pixel number along one axis and a source angle, corresponding to one of said plurality of X-ray source points, along a second axis. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification