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X-ray tomographic inspection system for the identification of specific target items

  • US 8,885,794 B2
  • Filed: 04/25/2013
  • Issued: 11/11/2014
  • Est. Priority Date: 04/25/2003
  • Status: Expired due to Term
First Claim
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1. A system for generating a sinogram, comprising:

  • a plurality of X-ray source points arranged around a scanning region;

    a first set of detectors arranged to detect X-rays transmitted through the scanning region;

    a second set of detectors arranged to detect X rays scattered from the scanning region; and

    a processing system for receiving unattenuated X-ray beam intensity data from the plurality of X-ray source points, for receiving attenuated X-ray beam intensity data from the first set of detectors, and for generating said sinogram from a function of said unattenuated X-ray beam intensity data and attenuated X-ray beam intensity data, wherein said sinogram comprises data arranged in an array with a pixel number along one axis and a source angle, corresponding to one of said plurality of X-ray source points, along a second axis.

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