Solid-state mass storage device and method for failure anticipation
First Claim
1. A solid-state mass storage device comprising:
- a controller;
at least one nonvolatile memory device comprising pages that are organized into memory blocks, at least a first memory block of the memory blocks being assigned as wear indicator means that is excluded from use as data storage for the nonvolatile memory device, and a plurality of the memory blocks being used as data blocks for data storage whereby data are written to and erased from each of the data blocks in program/erase (P/E) cycles;
means for performing wear leveling to maintain substantially the same level of usage across the data blocks;
means for subjecting the wear indicator means to P/E cycles so that the wear indicator means is subjected to a number of P/E cycles that is greater than the number of P/E cycles encountered by the data blocks;
means for performing integrity checks of the wear indicator means and monitoring a bit error rate thereof; and
means for analyzing failure patterns over consecutive P/E cycles of the wear indicator means.
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Accused Products
Abstract
A solid-state mass storage device and method of operating the storage device to anticipate the failure of at least one memory device thereof before a write endurance limitation is reached. The method includes assigning at least a first memory block of the memory device as a wear indicator that is excluded from use as data storage, using pages of at least a set of memory blocks of the memory device for data storage, writing data to and erasing data from each memory block of the set in program/erase (P/E) cycles, performing wear leveling on the set of memory blocks, subjecting the wear indicator to more P/E cycles than the set of memory blocks, performing integrity checks of the wear indicator and monitoring its bit error rate, and taking corrective action if the bit error rate increases.
11 Citations
7 Claims
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1. A solid-state mass storage device comprising:
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a controller; at least one nonvolatile memory device comprising pages that are organized into memory blocks, at least a first memory block of the memory blocks being assigned as wear indicator means that is excluded from use as data storage for the nonvolatile memory device, and a plurality of the memory blocks being used as data blocks for data storage whereby data are written to and erased from each of the data blocks in program/erase (P/E) cycles; means for performing wear leveling to maintain substantially the same level of usage across the data blocks; means for subjecting the wear indicator means to P/E cycles so that the wear indicator means is subjected to a number of P/E cycles that is greater than the number of P/E cycles encountered by the data blocks; means for performing integrity checks of the wear indicator means and monitoring a bit error rate thereof; and means for analyzing failure patterns over consecutive P/E cycles of the wear indicator means. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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Specification